Sub-micron spatial resolution in far-field Raman imaging via positivity constrained super-resolution
Abstract
Raman microscopy is a valuable tool for detecting physical and chemical properties of a sample material. When probing nanomaterials or nanocomposites the spatial resolution of Raman microscopy is not always adequate as it is limited by the optical diffraction limit. Numerical post-processing with super-resolution algorithms provides a means to enhance resolution and can be straightforwardly applied. The aim of this work is to present interior-point least squares (IPLS) as a powerful tool for super-resolution in Raman imaging through constrained optimisation. IPLS's potential for super-resolution is illustrated on numerically generated test images. Its resolving power is demonstrated on Raman spectroscopic data of a polymer nanowire sample. Comparison to AFM data of the same sample substantiates that the presented method is a promising technique for analysing nanomaterial samples.
Cite
@article{arxiv.1902.05576,
title = {Sub-micron spatial resolution in far-field Raman imaging via positivity constrained super-resolution},
author = {Dominik J. Winterauer and Daniel Funes-Hernando and Jean-Luc Duvail and Saïd Moussaoui and Tim Batten and Bernard Humbert},
journal= {arXiv preprint arXiv:1902.05576},
year = {2019}
}
Comments
21 pages, 8 figures