Single Defect Center Scanning Near-Field Optical Microscopy on Graphene

J. Tisler; T. Oeckinghaus; R. Stöhr; R. Kolesov; F. Reinhard; J. Wrachtrup

doi:10.1021/nl401129m

Single Defect Center Scanning Near-Field Optical Microscopy on Graphene

Mesoscale and Nanoscale Physics 2015-06-12 v1 Quantum Physics

Authors: J. Tisler , T. Oeckinghaus , R. Stöhr , R. Kolesov , F. Reinhard , J. Wrachtrup

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Abstract

We demonstrate high resolution scanning fluorescence resonance energy transfer 10 microscopy between a single nitrogen-vacancy center as donor and graphene as acceptor. 11 Images with few nanometer resolution of single and multilayer graphene structures were 12 attained. An energy transfer efficiency of 30% at distances of 10nm between a single 13 defect and graphene was measured. Further the energy transfer distance dependence of 14 the nitrogen-vacancy center to graphene was measured to show the predicted d-4 15 dependence. Our studies pave the way towards a diamond defect center based versatile 16 single emitter scanning microscope.

Keywords

graphene graphene plasmonics color centers in diamond

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@article{arxiv.1301.0218,
  title  = {Single Defect Center Scanning Near-Field Optical Microscopy on Graphene},
  author = {J. Tisler and T. Oeckinghaus and R. Stöhr and R. Kolesov and F. Reinhard and J. Wrachtrup},
  journal= {arXiv preprint arXiv:1301.0218},
  year   = {2015}
}

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12 pages, 3 figures

Single Defect Center Scanning Near-Field Optical Microscopy on Graphene

Abstract

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