Shot Noise in Linear Macroscopic Resistors
Materials Science
2009-11-10 v2 Mesoscale and Nanoscale Physics
Abstract
We report on a direct experimental evidence of shot noise in a linear macroscopic resistor. The origin of the shot noise comes from the fluctuation of the total number of charge carriers inside the resistor associated with their diffusive motion under the condition that the dielectric relaxation time becomes longer than the dynamic transit time. Present results show that neither potential barriers nor the absence of inelastic scattering are necessary to observe shot noise in electronic devices.
Keywords
Cite
@article{arxiv.cond-mat/0406484,
title = {Shot Noise in Linear Macroscopic Resistors},
author = {G. Gomila and C. Pennetta and L. Reggiani and M. Sampietro and G. Ferrari and G. Bertuccio},
journal= {arXiv preprint arXiv:cond-mat/0406484},
year = {2009}
}
Comments
10 pages, 5 figures