English

Semi-supervised logistic discrimination via labeled data and unlabeled data from different sampling distributions

Machine Learning 2014-02-20 v3 Methodology

Abstract

This article addresses the problem of classification method based on both labeled and unlabeled data, where we assume that a density function for labeled data is different from that for unlabeled data. We propose a semi-supervised logistic regression model for classification problem along with the technique of covariate shift adaptation. Unknown parameters involved in proposed models are estimated by regularization with EM algorithm. A crucial issue in the modeling process is the choices of tuning parameters in our semi-supervised logistic models. In order to select the parameters, a model selection criterion is derived from an information-theoretic approach. Some numerical studies show that our modeling procedure performs well in various cases.

Keywords

Cite

@article{arxiv.1108.5244,
  title  = {Semi-supervised logistic discrimination via labeled data and unlabeled data from different sampling distributions},
  author = {Shuichi Kawano},
  journal= {arXiv preprint arXiv:1108.5244},
  year   = {2014}
}

Comments

19 pages

R2 v1 2026-06-21T18:55:28.823Z