Second-Order Asymptotics of Two-Sample Tests
Abstract
In two-sampling testing, one observes two independent sequences of independent and identically distributed random variables distributed according to the distributions and and wishes to decide whether (null hypothesis) or (alternative hypothesis). The Gutman test for this problem compares the empirical distributions of the observed sequences and decides on the null hypothesis if the Jensen-Shannon (JS) divergence between these empirical distributions is below a given threshold. This paper proposes a generalization of the Gutman test, termed \emph{divergence test}, which replaces the JS divergence by an arbitrary divergence. For this test, the exponential decay of the type-II error probability for a fixed type-I error probability is studied. First, it is shown that the divergence test achieves the optimal first-order exponent, irrespective of the choice of divergence. Second, it is demonstrated that the divergence test with an invariant divergence achieves the same second-order asymptotics as the Gutman test. In addition, it is shown that the Gutman test is the GLRT for the two-sample testing problem, and a connection between two-sample testing and robust goodness-of-fit testing is established.
Keywords
Cite
@article{arxiv.2601.09196,
title = {Second-Order Asymptotics of Two-Sample Tests},
author = {K V Harsha and Jithin Ravi and Tobias Koch},
journal= {arXiv preprint arXiv:2601.09196},
year = {2026}
}
Comments
Submitted to the 2026 IEEE International Symposium on Information Theory