Charge density waves (CDW) have been reported in NdNiO2 and LaNiO2 thin films grown on SrTiO3 substrates using Ni-L3 resonant x-ray scattering in Refs. [1-3]. In their comment [arXiv:2306.15086] on these reports, Pelliciari et al. found no evidence for a CDW in a NdNiO2 film by performing fixed-momentum energy-dependent measurements. Instead, they observed a nearby non-resonant scattering peak, attributed to the (101) substrate reflection, made accessible at Ni-L3 due to third harmonic light contamination. Here we present fixed-momentum energy-dependent resonant inelastic x-ray scattering measurements across Ni-L3 on NdNiO2, used in the preceding study [1]. We see intrinsic Ni-L3 energy profiles at all measured \textbf{Q} values, including a strong resonance effect at QCDW=(−1/3,0,0.316) reciprocal lattice units. Attempts to measure the (101) substrate peak using third harmonic light at Ni-L3 at I21, Diamond were unfruitful. Our results clearly demonstrate the electronic origin of the scattering peak published in Ref. [1] and lack of a detectable structural component in the peak.
@article{arxiv.2307.13569,
title = {Reply to "Comment on newly found Charge Density Waves in infinite layer Nickelates''},
author = {Charles C. Tam and Jaewon Choi and Xiang Ding and Stefano Agrestini and Abhishek Nag and Mei Wu and Bing Huang and Huiqian Luo and Peng Gao and Mirian Garcia-Fernandez and Liang Qiao and Ke-Jin Zhou},
journal= {arXiv preprint arXiv:2307.13569},
year = {2023}
}