Optimal static and dynamic recycling of defective binary devices
Disordered Systems and Neural Networks
2009-11-10 v1 Statistical Mechanics
Abstract
The binary Defect Combination Problem consists in finding a fully working subset from a given ensemble of imperfect binary components. We determine the typical properties of the model using methods of statistical mechanics, in particular, the region in the parameter space where there is almost surely at least one fully-working subset. Dynamic recycling of a flux of imperfect binary components leads to zero wastage.
Cite
@article{arxiv.cond-mat/0407664,
title = {Optimal static and dynamic recycling of defective binary devices},
author = {Damien Challet and Isaac Perez Castillo},
journal= {arXiv preprint arXiv:cond-mat/0407664},
year = {2009}
}
Comments
14 pages, 15 figures