On stress-assisted boundary migration during recrystallization
Abstract
This study investigates the boundary migration mechanisms near the sample surface of recrystallizing grains in high-purity Al subjected to cryogenic rolling. Local strain and stress tensors were characterized during \textit{in situ} annealing by combining high-resolution electron backscatter diffraction with microstructure-based digital image correlation strain analysis. The results reveal local residual strains on the order of within the recrystallizing grain, with values several times higher in the adjacent deformed matrix. The residual stresses in recrystallizing grains are a passive response to those developed within the surrounding deformed grains; the latter being strongly influenced by the local geometry and characteristics of dislocation boundaries, as well as by constraints imposed by neighboring grains. No evidence of shear-coupled motion was observed during the recrystallization boundary migration, despite the presence of shear stress across the boundary. In contrast, detailed analysis of the principal strain components reveals a clear correlation between residual strain patterns and boundary migration directions. These findings indicate that recrystallization boundary migration is modulated by the anisotropy of the local internal stress state.
Cite
@article{arxiv.2604.10653,
title = {On stress-assisted boundary migration during recrystallization},
author = {Yubin Zhang and Qiwei Shi and Guilin Wu},
journal= {arXiv preprint arXiv:2604.10653},
year = {2026}
}