English

New Statistical Framework for Extreme Error Probability in High-Stakes Domains for Reliable Machine Learning

Machine Learning 2025-04-01 v1 Artificial Intelligence Methodology Machine Learning

Abstract

Machine learning is vital in high-stakes domains, yet conventional validation methods rely on averaging metrics like mean squared error (MSE) or mean absolute error (MAE), which fail to quantify extreme errors. Worst-case prediction failures can have substantial consequences, but current frameworks lack statistical foundations for assessing their probability. In this work a new statistical framework, based on Extreme Value Theory (EVT), is presented that provides a rigorous approach to estimating worst-case failures. Applying EVT to synthetic and real-world datasets, this method is shown to enable robust estimation of catastrophic failure probabilities, overcoming the fundamental limitations of standard cross-validation. This work establishes EVT as a fundamental tool for assessing model reliability, ensuring safer AI deployment in new technologies where uncertainty quantification is central to decision-making or scientific analysis.

Keywords

Cite

@article{arxiv.2503.24262,
  title  = {New Statistical Framework for Extreme Error Probability in High-Stakes Domains for Reliable Machine Learning},
  author = {Umberto Michelucci and Francesca Venturini},
  journal= {arXiv preprint arXiv:2503.24262},
  year   = {2025}
}
R2 v1 2026-06-28T22:40:51.089Z