We present a detailed study of the mechanism by which the INVERT method [Phys. Rev. Lett. 104, 125501] guides structure refinement of disordered materials. We present a number of different possible implementations of the central algorithm and explore the question of algorithm weighting. Our analysis includes quantification of the relative contributions of variance and fit-to-data terms during structure refinement, which leads us to study the roles of density fluctuations and configurational jamming in the RMC fitting process. We present a parametric study of the pair distribution function solution space for C60, a-Si and a-SiO2, which serves to highlight the difficulties faced in developing a transferable weighting scheme.
@article{arxiv.1302.1514,
title = {Nanostructure determination from the pair distribution function: A parametric study of the INVERT approach},
author = {Matthew J. Cliffe and Andrew L. Goodwin},
journal= {arXiv preprint arXiv:1302.1514},
year = {2015}
}
Comments
15 pages, 7 figures, formatted for JPCM (RMC issue)