English

Ion beam analysis and big data: How data science can support next-generation instrumentation

Instrumentation and Detectors 2022-05-13 v1 Applied Physics

Abstract

With a growing demand for accurate ion beam analysis on a large number of samples, it becomes an issue of how to ensure the quality standards and consistency over hundreds or thousands of samples. In this sense, a virtual assistant that checks the data quality, emitting certificates of quality, is highly desired. Even the processing of a massive number of spectra is a problem regarding the consistency of the analysis. In this work, we report the design and first results of a virtual layer under implementation in our laboratory. It consists of a series of systems running in the cloud that perform the mentioned tasks and serves as a virtual assistant for member staff and users. We aim to bring the concept of the Internet of Things and artificial intelligence closer to the laboratory to support a new generation of instrumentation.

Keywords

Cite

@article{arxiv.2205.05680,
  title  = {Ion beam analysis and big data: How data science can support next-generation instrumentation},
  author = {Tiago F. Silva and Cleber L. Rodrigues and Manfredo H. Tabacniks and Hugo D. C. Pereira and Thiago B. Saramela and Renato O. Guimarães},
  journal= {arXiv preprint arXiv:2205.05680},
  year   = {2022}
}

Comments

9 pages, 4 figures, 2019 Ion Beam Analysis Conference

R2 v1 2026-06-24T11:14:38.499Z