English

Introducing new resonant soft x-ray scattering capability in SSRL

Instrumentation and Detectors 2025-06-10 v2 Materials Science

Abstract

Resonant soft X-ray scattering (RSXS) is a powerful technique for probing both spatial and electronic structures within solid-state systems. We present a newly developed RSXS capability at beamline 13-3 of the Stanford Synchrotron Radiation Lightsource (SSRL), designed to enhance materials science research. This advanced setup achieves a base sample temperature as low as 9.8 K combined with extensive angular motions (azimuthal \phi and flipping \chi), enabling comprehensive exploration of reciprocal space. Two types of detectors, an Au/GaAsP Schottky photodiode and a CCD detector with over 95% quantum efficiency, are integrated to effectively capture scattered photons. Extensive testing has confirmed the enhanced functionality of this RSXS setup, including its temperature and angular performance. The versatility and effectiveness of the system have been demonstrated through studies of various materials, including superlattice heterostructures and high-temperature superconductors.

Keywords

Cite

@article{arxiv.2501.05526,
  title  = {Introducing new resonant soft x-ray scattering capability in SSRL},
  author = {Cheng-Tai Kuo and Makoto Hashimoto and Heemin Lee and Tan Thanh Huynh and Abraham Maciel and Zina Zhang and Dehong Zhang and Benjamin Edwards and Farzan Kazemifar and Chi-Chang Kao and Donghui Lu and Jun-Sik Lee},
  journal= {arXiv preprint arXiv:2501.05526},
  year   = {2025}
}

Comments

23 pages, 7 figures, 1 table

R2 v1 2026-06-28T21:01:52.616Z