Integrated anti-electronics for positron annihilation spectroscopy
Abstract
Imaging the features of a sample using Positron Annihilation Spectroscopy (PAS) is currently achieved by rastering, i.e. by scanning the sample surface with a sharply focused positron beam. However, a beam of arbitrary shape (sculpted beam) would allow the application of more versatile single-pixel imaging (SPI) techniques. I introduce the design of a microelectronic device employing a 2D array of Zener diodes as an active positron moderator, capable of sculpting positron beams with 6um resolution. The re-emitted positrons are accelerated towards the sample through a miniaturised electrostatic lens system and reaching 100nm resolution. The fast switch-on (90ps) and switch-off (250ps) time of the device would enable state-of-the-art positron annihilation lifetime spectroscopy (PALS) and PAS imaging with high spatial and temporal resolution.
Cite
@article{arxiv.2402.01307,
title = {Integrated anti-electronics for positron annihilation spectroscopy},
author = {Francesco Guatieri},
journal= {arXiv preprint arXiv:2402.01307},
year = {2024}
}
Comments
8 pages, 5 figures