High-resolution long-working-distance reference-free holographic microscopy exploiting speckle-correlation scattering matrix
Abstract
Using conventional refraction-based optical lens, it is challenging to achieve both high-resolution imaging and long-working-distance condition. To increase the numerical aperture of a lens, the working distance should be compensated, and vice versa. Here we propose and demonstrate a new concept in optical microscopy that can achieve both high-resolution imaging and long-working-distance conditions by utilising a scattering layer instead of refractive optics. When light passes through a scattering layer, it creates a unique interference pattern. To retrieve the complex amplitude image from the interference pattern without introducing a reference beam, we utilised a speckle-correlation scattering matrix method. This property enables holographic microscopy without any lens or external reference beam. Importantly, the proposed method allows high-resolution imaging with a long working distance beyond what a conventional objective lens can achieve. As an experimental verification, we imaged various microscopic samples and compared their performance with off-axis digital holographic microscopy.
Cite
@article{arxiv.1802.10321,
title = {High-resolution long-working-distance reference-free holographic microscopy exploiting speckle-correlation scattering matrix},
author = {YoonSeok Baek and KyeoReh Lee and YongKeun Park},
journal= {arXiv preprint arXiv:1802.10321},
year = {2018}
}