Fidelity based Measurement Induced Nonlocality over two-sided measurements
Quantum Physics
2019-02-06 v1
Abstract
In this paper, we introduce quantum fidelity based measurement induced nonlocality for the bipartite state over two-sided von Neumann projective measurements. While all the properties of this quantity are reflected from that of one-sided measurement, the latter one is shown to set an upper bound for arbitrary bipartite state. As an illustration, we have studied the nonlocality of Bell diagonal state.
Cite
@article{arxiv.1802.05660,
title = {Fidelity based Measurement Induced Nonlocality over two-sided measurements},
author = {R. Muthuganesan and R. Sankaranarayanan},
journal= {arXiv preprint arXiv:1802.05660},
year = {2019}
}
Comments
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