Electrostatic Friction Force on an AFM probe Moving Near a Sample Surface
Mesoscale and Nanoscale Physics
2018-12-05 v1
Abstract
Within the framework of nonrelativistic electrodynamics, general formulas have been obtained for the tangential dissipative force of electrostatic friction and the normal force of attraction to the surface of an axially symmetric probe moving parallel to the smooth surface of homogeneous materials or coated with thin films substrates with various combinations of materials. As a numerical example, the interaction of a metal ball moving above a metal surface has been studied. The results of the calculations are compared with the available experimental and theoretical results of other authors.
Cite
@article{arxiv.1709.07832,
title = {Electrostatic Friction Force on an AFM probe Moving Near a Sample Surface},
author = {G. V. Dedkov and A. A. Kanametov},
journal= {arXiv preprint arXiv:1709.07832},
year = {2018}
}
Comments
15 pages, 4 figures