Designing Topological Defect Lines Protected by Gauge-dependent Symmetry Indicators
Abstract
Symmetry indicators are a modern tool for characterizing topological phases that require only minimal computational expense but provide an elegant means of designing practical devices. This paper demonstrates how a rotational symmetry indicator can be used to construct and characterize a topologically robust waveguide, which is then verified experimentally on a printed circuit board (PCB) platform. The design takes advantage of the real-space gauge-dependency of the symmetry indicators and adopts a lattice with simple shifts, forming a defect line supporting topological edge modes. It is shown that the modes can realize the same features as previous topological waveguides, but in addition possesses a greater degree of reconfigurability and the unique ability to form a one-way termination. Moreover, the design illustrates the critical role real space information plays in determining the topological properties of photonic crystals, enabling a wider range of possible realizations.
Cite
@article{arxiv.2201.05907,
title = {Designing Topological Defect Lines Protected by Gauge-dependent Symmetry Indicators},
author = {Erda Wen and Dia'aaldin J. Bisharat and Robert J. Davis and Xiaozhen Yang and Daniel F. Sievenpiper},
journal= {arXiv preprint arXiv:2201.05907},
year = {2022}
}