English

Deep Steganalysis: End-to-End Learning with Supervisory Information beyond Class Labels

Computer Vision and Pattern Recognition 2018-06-28 v1

Abstract

Recently, deep learning has shown its power in steganalysis. However, the proposed deep models have been often learned from pre-calculated noise residuals with fixed high-pass filters rather than from raw images. In this paper, we propose a new end-to-end learning framework that can learn steganalytic features directly from pixels. In the meantime, the high-pass filters are also automatically learned. Besides class labels, we make use of additional pixel level supervision of cover-stego image pair to jointly and iteratively train the proposed network which consists of a residual calculation network and a steganalysis network. The experimental results prove the effectiveness of the proposed architecture.

Keywords

Cite

@article{arxiv.1806.10443,
  title  = {Deep Steganalysis: End-to-End Learning with Supervisory Information beyond Class Labels},
  author = {Wei Wang and Jing Dong and Yinlong Qian and Tieniu Tan},
  journal= {arXiv preprint arXiv:1806.10443},
  year   = {2018}
}
R2 v1 2026-06-23T02:43:29.139Z