We present the latest generation of superconductor-insulator-ferromagnet-superconductor Josephson tunnel junctions with a step-like thickness of the ferromagnetic (F) layer. The F-layer thicknesses d1 and d2 in both halves were varied to obtain different combinations of positive and negative critical current densities jc,1 and jc,2. The measured dependences of the critical current on applied magnetic field can be well described by a model which takes into account different critical current densities (obtained from reference junctions) and different net magnetization of the multidomain ferromagnetic layer in both halves.
@article{arxiv.1006.5109,
title = {Critical current diffraction pattern of SIFS Josephson junctions with step-like F-layer},
author = {M. Weides and U. Peralagu and H. Kohlstedt and J. Pfeiffer and M. Kemmler and C. Gürlich and E. Goldobin and D. Koelle and R. Kleiner},
journal= {arXiv preprint arXiv:1006.5109},
year = {2010}
}