English

Correction of STEM Distortions

Instrumentation and Detectors 2026-05-13 v1 Data Analysis, Statistics and Probability
Authors: Pavel Potapov , Giulio Guzzinati
View on arXiv ↗ PDF ↗

Abstract

The manuscript considers Scanning Transmission Electron Microscopy (STEM) images and derives transformations needed to correct various distortions occurring during scanning. These transformations form the basis for the correction algorithms implemented in the CEOS Panta Rhei and TEMDM software. The manuscript is intended as a technical reference and is meant to be published only on arXiv rather than in peer-reviewed journals.

Cite

@article{arxiv.2605.11018,
  title  = {Correction of STEM Distortions},
  author = {Pavel Potapov and Giulio Guzzinati},
  journal= {arXiv preprint arXiv:2605.11018},
  year   = {2026}
}

Related papers

View all related →
Materials Science · Physics
Identification and Correction of Temporal and Spatial Distortions in Scanning Transmission Electron Microscopy
Kevin M. Roccapriore, Nicole Creange, Maxim Ziatdinov, Sergei V. Kalinin
2021-10-05
Computational Physics · Physics
Deep convolutional neural networks to restore single-shot electron microscopy images
I. Lobato, T. Friedrich, S. Van Aert
2023-03-31
Materials Science · Physics
Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy
Stephanie M. Ribet, Steven E. Zeltmann, Karen C. Bustillo, Rohan Dhall +5
2023-03-20
Instrumentation and Detectors · Physics
Compressed Sensing of Scanning Transmission Electron Microscopy (STEM) on Non-Rectangular Scans
Xin Li, Ondrej Dyck, Sergei V. Kalinin, Stephen Jesse
2019-01-15
Computer Vision and Pattern Recognition · Computer Science
Joint denoising and distortion correction of atomic scale scanning transmission electron microscopy images
Benjamin Berkels, Benedikt Wirth
2017-09-13
Materials Science · Physics
Materials Structure, Properties and Dynamics through Scanning Transmission Electron Microscopy
Stephen J. Pennycook, Changjian Li, Mengsha Li, Chunhua Tang +4
2019-08-21
Applied Physics · Physics
Joint non-rigid image registration and reconstruction for quantitative atomic resolution scanning transmission electron microscopy
Benjamin Berkels, Christian H. Liebscher
2019-01-16
Signal Processing · Electrical Eng. & Systems
Fast Simulation of Damage Diffusion Distribution in Scanning Transmission Electron Microscopy
Amir Javadi Rad, Amirafshar Moshtaghpour, Dongdong Chen, Angus I. Kirkland
2025-07-02
Instrumentation and Detectors · Physics
Predictive drift compensation of multi-frame STEM via live scan modification
Matthew Mosse, Jonathan J. P. Peters, Eoin Moynihan, James A. Gott +3
2026-04-23
Instrumentation and Detectors · Physics
Cost & Capability Compromises in STEM Instrumentation for Low-Voltage Imaging
Frances Quigley, Patrick McBean, Peter O'Donovan, Jonathan J. P. Peters +1
2022-07-27
Materials Science · Physics
Diffusion Distribution Model for Damage Mitigation in Scanning Transmission Electron Microscopy
Amirafshar Moshtaghpour, Abner Velazco-Torrejon, Daniel Nicholls, Alex W. Robinson +2
2024-06-05
Instrumentation and Detectors · Physics
Emittance Minimization for Aberration Correction II: Physics-informed Bayesian Optimization of an Electron Microscope
Desheng Ma, Steven E. Zeltmann, Chenyu Zhang, Zhaslan Baraissov +5
2025-01-27
Instrumentation and Detectors · Physics
Increasing Spatial Fidelity and SNR of 4D-STEM using Multi-frame Data Fusion
Colum M. O'Leary, Benedikt Haas, Christoph T. Koch, Peter D. Nellist +1
2022-07-27
Instrumentation and Detectors · Physics
Development of a fast electromagnetic shutter for compressive sensing imaging in scanning transmission electron microscopy
Armand Béché, Bart Goris, Bert Freitag, Jo Verbeeck
2016-03-23
Materials Science · Physics
Extended Depth of Field for High Resolution Scanning Transmission Electron Microscopy
Robert Hovden, Huolin L. Xin, David A. Muller
2011-12-15
Signal Processing · Electrical Eng. & Systems
Compressive Scanning Transmission Electron Microscopy
Daniel Nicholls, Alex Robinson, Jack Wells, Amirafshar Moshtaghpour +3
2021-12-23
Materials Science · Physics
Cepstral Scanning Transmission Electron Microscopy Imaging of Severe Lattice Distortions
Yu-Tsun Shao, Renliang Yuan, Haw-Wen Hsiao, Qun Yang +2
2021-01-19
Materials Science · Physics
Unsupervised Reward-Driven Image Segmentation in Automated Scanning Transmission Electron Microscopy Experiments
Kamyar Barakati, Utkarsh Pratiush, Austin C. Houston, Gerd Duscher +1
2024-09-23
Instrumentation and Detectors · Physics
Compressive multi-beam scanning transmission electron microscopy
Akira Yasuhara, Takumi Sannomiya, Ryoichi Horisaki
2026-03-19
Instrumentation and Detectors · Physics
Emittance Minimization for Aberration Correction I: Aberration correction of an electron microscope without knowing the aberration coefficients
Desheng Ma, Steven E. Zeltmann, Chenyu Zhang, Zhaslan Baraissov +5
2024-12-31
Computer Vision and Pattern Recognition · Computer Science
Bridging the Simulation-to-Reality Gap in Electron Microscope Calibration via VAE-EM Estimation
Jilles S. van Hulst, W. P. M. H. Heemels, Duarte J. Antunes
2026-03-20
Computer Vision and Pattern Recognition · Computer Science
Noise Calibration and Spatial-Frequency Interactive Network for STEM Image Enhancement
Hesong Li, Ziqi Wu, Ruiwen Shao, Tao Zhang +1
2025-04-04
Mesoscale and Nanoscale Physics · Physics
STEM image analysis based on deep learning: identification of vacancy defects and polymorphs of ${MoS_2}$
Kihyun Lee, Jinsub Park, Soyeon Choi, Yangjin Lee +8
2022-06-10
Instrumentation and Detectors · Physics
An Accessible Method for Simulating Charged-Particle Optics, with Examples for Transmission Electron Microscopy
Patrick McBean, Zachary Milne, Arjun Kanthawar, Cameron O'Byrne +2
2022-12-07
Instrumentation and Detectors · Physics
Real-Time Scanning Charged-Particle Microscope Image Composition with Correction of Drift
Petr Cizmar, Andras E. Vladar, Michael T. Postek
2010-08-09
R2 v1 2026-07-22T07:05:28.188Z