English

Certified Hardness vs. Randomness for Log-Space

Computational Complexity 2023-03-30 v1 Data Structures and Algorithms

Abstract

Let L\mathcal{L} be a language that can be decided in linear space and let ϵ>0\epsilon >0 be any constant. Let A\mathcal{A} be the exponential hardness assumption that for every nn, membership in L\mathcal{L} for inputs of length~nn cannot be decided by circuits of size smaller than 2ϵn2^{\epsilon n}. We prove that for every function f:{0,1}{0,1}f :\{0,1\}^* \rightarrow \{0,1\}, computable by a randomized logspace algorithm RR, there exists a deterministic logspace algorithm DD (attempting to compute ff), such that on every input xx of length nn, the algorithm DD outputs one of the following: 1: The correct value f(x)f(x). 2: The string: ``I am unable to compute f(x)f(x) because the hardness assumption A\mathcal{A} is false'', followed by a (provenly correct) circuit of size smaller than 2ϵn2^{\epsilon n'} for membership in L\mathcal{L} for inputs of length~nn', for some n=Θ(logn)n' = \Theta (\log n); that is, a circuit that refutes A\mathcal{A}. Our next result is a universal derandomizer for BPLBPL: We give a deterministic algorithm UU that takes as an input a randomized logspace algorithm RR and an input xx and simulates the computation of RR on xx, deteriministically. Under the widely believed assumption BPL=LBPL=L, the space used by UU is at most CRlognC_R \cdot \log n (where CRC_R is a constant depending on~RR). Moreover, for every constant c1c \geq 1, if BPLSPACE[(log(n))c]BPL\subseteq SPACE[(\log(n))^{c}] then the space used by UU is at most CR(log(n))cC_R \cdot (\log(n))^{c}. Finally, we prove that if optimal hitting sets for ordered branching programs exist then there is a deterministic logspace algorithm that, given a black-box access to an ordered branching program BB of size nn, estimates the probability that BB accepts on a uniformly random input. This extends the result of (Cheng and Hoza CCC 2020), who proved that an optimal hitting set implies a white-box two-sided derandomization.

Keywords

Cite

@article{arxiv.2303.16413,
  title  = {Certified Hardness vs. Randomness for Log-Space},
  author = {Edward Pyne and Ran Raz and Wei Zhan},
  journal= {arXiv preprint arXiv:2303.16413},
  year   = {2023}
}

Comments

Abstract shortened to fit arXiv requirements

R2 v1 2026-06-28T09:39:07.682Z