A Unifying Approach to Probabilistic Testing Equivalences
Abstract
Probabilistic concurrent systems are foundational models for modern mobile computing. In this paper, a unifying approach to probabilistic testing equivalences is proposed. With the help of a new distribution-based semantics for probabilistic models and a probabilistic testing framework with respect to process predicates, the internal characterization and the external characterization for testing equivalences are studied. The latter characterization can be viewed as the generalization of the classical fair/should equivalence and may equivalence. These equivalences are shown to be congruences. A thorough comparison between these equivalences and probabilistic bisimilarities is carried out. The techniques introduced in this paper can be easily extended to other probabilistic concurrent models. To showcase this flexibility, a case study is carried out on the pCSP model.
Cite
@article{arxiv.2507.19886,
title = {A Unifying Approach to Probabilistic Testing Equivalences},
author = {Weijun Chen and Yuxi Fu and Huan Long and Hao Wu},
journal= {arXiv preprint arXiv:2507.19886},
year = {2026}
}