English

A Style-Based Profiling Framework for Quantifying the Synthetic-to-Real Gap in Autonomous Driving Datasets

Computer Vision and Pattern Recognition 2026-01-27 v3

Abstract

Ensuring the reliability of autonomous driving perception systems requires extensive environment-based testing, yet real-world execution is often impractical. Synthetic datasets have therefore emerged as a promising alternative, offering advantages such as cost-effectiveness, bias free labeling, and controllable scenarios. However, the domain gap between synthetic and real-world datasets remains a major obstacle to model generalization. To address this challenge from a data-centric perspective, this paper introduces a profile extraction and discovery framework for characterizing the style profiles underlying both synthetic and real image datasets. We propose Style Embedding Distribution Discrepancy (SEDD) as a novel evaluation metric. Our framework combines Gram matrix-based style extraction with metric learning optimized for intra-class compactness and inter-class separation to extract style embeddings. Furthermore, we establish a benchmark using publicly available datasets. Experiments are conducted on a variety of datasets and sim-to-real methods, and the results show that our method is capable of quantifying the synthetic-to-real gap. This work provides a standardized profiling-based quality control paradigm that enables systematic diagnosis and targeted enhancement of synthetic datasets, advancing future development of data-driven autonomous driving systems.

Keywords

Cite

@article{arxiv.2510.10203,
  title  = {A Style-Based Profiling Framework for Quantifying the Synthetic-to-Real Gap in Autonomous Driving Datasets},
  author = {Dingyi Yao and Xinyao Han and Ruibo Ming and Zhihang Song and Lihui Peng and Jianming Hu and Danya Yao and Yi Zhang},
  journal= {arXiv preprint arXiv:2510.10203},
  year   = {2026}
}

Comments

Accepted for publication at the 2026 IEEE Intelligent Vehicles Symposium (IEEE IV 2026)

R2 v1 2026-07-01T06:31:22.492Z