A Study on Improvement of Image Quality in Quantum Polarized Microscopy using an Entangled-Photon Source

Quantum imaging is an advanced method for microscopy or investigating the optical properties of materials or bio-medical inspections with high accuracy, low noise, and extremely low photo-damage. In previous work, we proposed a quantum imaging technique, in which variations in polarization angle due to reflection or transmission at the sample enhance image contrast in the second-order autocorrelation function at zero delay g2(0). However, the image resolution observed was not satisfactory. In this report, to improve the image quality, the parameters such as coincidence window was optimized to distinguish photon statistics effectively due to change in polarization angle and the objective lens was utilized to focus the entangled photon beams. These modifications enabled optical imaging by accurately detecting slight polarization variations in different media. It is suggested that the proposed method enables a superior imaging performance even in the presence of noise and low-power illumination requirement, offering new possibilities for high-quality imaging applications.