X-ray ionized reflection occurs when a surface is irradiated with X-rays so intense that its ionization state is determined by the ionization parameter xi propto F/n, where F is the incident flux and n the gas density. It occurs in accretion, onto compact objects including black holes in both active galaxies and stellar-mass binaries, and possibly in gamma-ray bursts. Computation of model reflection spectra is often time-consuming. Here we present the results from a comprehensive grid of models computed with our code, which has now been extended to include what we consider to be all energetically-important ionization states and transitions. This grid is being made available as an ionized-reflection model, REFLION, for XSPEC.
@article{arxiv.astro-ph/0501116,
title = {A comprehensive range of X-ray ionized reflection models},
author = {R. R. Ross and A. C. Fabian},
journal= {arXiv preprint arXiv:astro-ph/0501116},
year = {2010}
}
Comments
6 pages, 8 Figures, accepted for publication in MNRAS