Related papers: Wave function collapses in a single spin magnetic …
A requirement for many quantum computation schemes is the ability to measure single spins. This paper examines one proposed scheme: magnetic resonance force microscopy, including the effects of thermal noise and back-action from monitoring.…
We analyze the back-action influence of nuclear spins on the motion of the cantilever of a magnetic force resonance microscope. We calculate the contribution of nuclear spins to the damping and frequency shift of the cantilever. We show…
We use microwave induced adiabatic passages for selective spin flips within a string of optically trapped individual neutral Cs atoms. We position-dependently shift the atomic transition frequency with a magnetic field gradient. To flip the…
The separation of physical forces acting on the tip of a magnetic force microscope (MFM) is essential for correct magnetic imaging. Electrostatic forces can be modulated by varying the tip-sample potential and minimized to map the local…
The MRFM device is a powerful setup for manipulating single electron spin in resonance in a magnetic field. However, the real time observation of a resonating spin is still an issue because of the very low SNR of the output signal. This…
Magnetic Resonance Force Microscopy (MRFM) describes a range of approaches to detect nuclear spins with mechanical sensors. MRFM has the potential to enable magnetic resonance imaging (MRI) with near-atomic spatial resolution, opening up…
We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band…
Magnetic friction is a form of non-contact friction arising from the dissipation of energy in a magnet due to spin reorientation in a magnetic field. In this paper we study magnetic friction in the context of micromagnetics, using our…
We analyze a single-spin measurement using a transient process in magnetic force microscopy (MFM) which could increase the maximum operating temperature by a factor of Q (the quality factor of the cantilever) in comparison with the static…
It is demonstrated that the decay time of spin-wave modes existing in a magnetic insulator can be reduced or enhanced by injecting an in-plane dc current, $I_\text{dc}$, in an adjacent normal metal with strong spin-orbit interaction. The…
A method to measure the electrical resistivity of materials using magnetic-force microscopy (MFM) is discussed, where MFM detects the magnetic field caused by the tip-oscillation-induced eddy current. To achieve high sensitivity, a high…
We compute the shift in the frequency of the spin resonance in a solid that rotates in the field of a circularly polarized electromagnetic wave. Electron spin resonance, nuclear magnetic resonance, and ferromagnetic resonance are…
A dual-excitation method for resonant-frequency tracking in scanning probe microscopy based on amplitude detection is developed. This method allows the cantilever to be operated at or near resonance for techniques where standard phase…
We report mechanical detection of ferromagnetic resonance signals from microscopic Co single layer thin films using a magnetic resonance force microscope (MRFM). Variations in the magnetic anisotropy field and the inhomogeneity of were…
Frequency dependent dynamic behavior in Piezoresponse Force Microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analyzed using a combination of modeling and experimental measurements. The PFM signal comprises…
Van der Waals (vdW) antiferromagnets are exceptional platforms for exploring the spin dynamics of antiferromagnetic materials owing to their weak interlayer exchange coupling. In this study, we examined the antiferromagnetic resonance…
The dynamic behavior of AFM is studied taking into account the nonlinear interaction forces between probe and sample. The exerted forces on the free end of micro-beam are simulated with the third degree polynomial. The effect of some…
Atomic Force Microscopy with SideWall (AFM SW) is widely used for nano-scale surface measurements at side surfaces. In the current study, by taking into consideration the effects of sidewall beam and its probe, an analytical method is…
We consider an oscillator model to describe qualitatively friction force for an atomic force mi-croscope (AFM) tip driven on a surface described by periodic potential. It is shown that average value of the friction force could be controlled…
Magnetic force microscopy (MFM) is a well-established technique in scanning probe microscopy that allows for the imaging of magnetic samples with a spatial resolution of tens of nm and stray fields down to the mT range. The spatial…