Related papers: Imaging Microwave Electric Fields Using a Near-Fie…
We describe a scanning device where a single spin is used as an ultrasensitive, nanoscale magnetic field sensor. As this "probe spin" we consider a single nitrogen-vacancy defect center in a diamond nanocrystal, attached to the tip of the…
A conceptual set-up for measuring the electric field in silicon detectors by electro-optical imaging is proposed. It is based on the Franz-Keldysh effect which describes the electric field dependence of the absorption of light with an…
Electric Scanning Probe Microscopies are used to characterize the surface behavior of ferroelectric materials. The effects of local charge density on the chemistry and physics of ferroelectric surfaces are investigated. The kinetics and…
A simple experiment is presented which indicates that electromagnetic fields propagate superluminally in the near-field next to an oscillating electric dipole source. A high frequency 437MHz, 2 watt sinusoidal electrical signal is…
The ability to image electromagnetic fields holds key scientific and industrial applications, including electromagnetic compatibility, diagnostics of high-frequency devices, and experimental scientific work involving field interactions.…
Superconducting NbN wires have recently received attention as detectors for visible and infrared photons. We present experiments in which we use a NbN wire for high-efficiency (40 %) detection of single electrons with keV energy. We use the…
The Far Ultraviolet Spectroscopic Explorer satellite observes light in the far-ultraviolet spectral region, 905 - 1187 A with high spectral resolution. The instrument consists of four coaligned prime-focus telescopes and Rowland…
Ultrafast electron microscopy aims for imaging transient phenomena occurring on nanoscale. One of its goals is to visualize localized optical and plasmonic modes generated by coherent excitation in the vicinity of various types of…
We use an atomic vapor cell as a frequency tunable microwave field detector operating at frequencies from GHz to tens of GHz. We detect microwave magnetic fields from 2.3 GHz to 26.4 GHz, and measure the amplitude of the sigma+ component of…
Probing optical excitations with nanometer resolution is important for understanding their dynamics and interactions down to the atomic scale. Electron microscopes currently offer the unparalleled ability of rendering spatially-resolved…
High-quality spatially-resolved measurements of electric fields are critical to understanding charge injection, charge transport, and charge trapping in semiconducting materials. Here, we report a variation of frequency-modulated Kelvin…
Future wireless communication system embraces physical-layer signal detection with high sensitivity, especially in the microwave photon level. Currently, the receiver primarily adopts the signal detection based on semi-conductor devices for…
We demonstrate a scanning force microscope, based upon a quartz tuning fork, that operates below 100 mK and in magnetic fields up to 6 T. The microscope has a conducting tip for electrical probing of nanostructures of interest, and it…
Aberration-corrected scanning transmission electron microscopes (STEM) provide sub-angstrom lateral resolution; however, the large convergence angle greatly reduces the depth of field. For microscopes with a small depth of field,…
We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band…
Recent progress in the development of superconducting circuits has enabled the realization of interesting sources of nonclassical radiation at microwave frequencies. Here, we discuss field quadrature detection schemes for the experimental…
We describe the use of a near-field scanning microwave microscope to image the permittivity and tunability of bulk and thin film dielectric samples on a length scale of about 1 micron. The microscope is sensitive to the linear permittivity,…
Aperture based scanning near field optical microscopes are important instruments to study light at the nanoscale and to understand the optical functionality of photonic nanostructures. In general, a detected image is affected by both, the…
Local electrical imaging using microwave impedance microscope is performed on graphene in different modalities, yielding a rich hierarchy of the local conductivity. The low-conductivity graphite oxide and its derivatives show significant…
Electric field measurement in plasmas permits quantitative comparison between the experiment and the simulation in this study. An electro-optic (EO) sensor based on Pockels effect is demonstrated to measure wave electric fields in the…