Related papers: X-Ray Reflectivity of Fibonacci Multilayers
We determine the range of thicknesses and refractive indices for which omnidirectional reflection from quasiperiodic multilayers occurs. By resorting to the notion of area under the transmittance curve, we assess in a systematic way the…
In this paper a theory of reflective X-ray multilayer structures with a graded (slowly varying) period based on the coupled waves method and quasi-classical asymptotic expansions is reported. A number of exact solutions of the coupled wave…
Multilayer X-ray mirrors consist of a coating of a large number of alternate layers of high Z and low Z materials with a typical thickness of 10-100 Angstrom, on a suitable substrate. Such coatings play an important role in enhancing the…
To enhance the reflectivity of X-ray mirrors beyond the critical angle, multilayer coatings are required. Interface imperfections in the multilayer growth process are known to cause non-specular scattering and degrade the mirror optical…
We experimentally demonstrate the effect of anomalous breakdown of the effective medium approximation in all-dielectric deeply subwavelength thickness ($d \sim\lambda/160-\lambda/30$) multilayers, as recently predicted theoretically [H.H.…
Periodic multilayers of various periods were prepared according to an algorithm proposed by the authors. The reflectivity properties of these systems were investigated using neutron reflectometry.The obtained experimental results were…
Decades of work on beam deformation on reflection, and especially on lateral shifts, have spread the idea that a reflected beam is larger than the incident beam. However, when the right conditions are met, a beam reflected by a multilayered…
Periodic layered media can reflect strongly for all incident angles and polarizations in a given frequency range. Quarter-wave stacks at normal incidence are commonplace in the design of such omnidirectional reflectors. We discuss…
In this Letter, we study theoretically reflectance of a monolayer comprizing regularly spaced quantum $\Lambda$-emitters. Due to high density of the latter, the monolayer almost totally reflects the incident field in the vicinity of the…
The values of the signal-to-noise ratio are determined, at which the method of processing X-ray diffraction data reveals reflections with intensity less than the noise component of the background. The possibilities of the method are…
Even after several decades of systematic usage of X-ray diffraction as one of the major analytical tool for epitaxic layers, the vision of the reciprocal space of these materials is still a simple superposition of two reciprocal lattices,…
We have developed an improved method of time-resolved x-ray reflectivity (XRR) using monochromatic synchrotron radiation. Our method utilizes a polycapillary x-ray optic to create a range of incident angles and an area detector to collect…
When an X-ray area detector based on a single crystalline material, for instance, a state of the art hybrid pixel detector, is illuminated from a point source by monochromatic radiation, a pattern of lines appears which overlays the…
Relying on atomic scattering factors from evaluated databases, a new model for the reflectivity of x rays on solid surfaces has been developed for FLUKA v4-6.0. This model accounts for the variation of reflectivity as a function of the…
The theoretical formulation of x-ray resonant magnetic scattering from rough surfaces and interfaces is given for specular reflectivity. A general expression is derived for both structurally and magnetically rough interfaces in the…
A versatile X-ray/neutron reflectivity (specular) simulator using LabVIEW(National Instruments Corp.) for structural study of a multi-layer thin film having any combination, including the repetitions, of nano-scale layers of different…
Monolayer graphene absorbs 2.3 percent of the incident visible light. This 'small' absorption has been used to emphasize the visual transparency of graphene, but it in fact means that multilayer graphene absorbs a sizable fraction of…
The random layer thickness variations can induce a great deformation of the experimental reflection of broadband extreme ultraviolet multilayer. In order to reduce this influence of random layer thickness fluctuations, the multiobjective…
We study X-ray diffraction in smectic liquid crystal multilayers. Such systems are fabricated as freely suspended films and have a unique layered structure. As such, they can be described as organic Bragg mirrors with sub-nanometer…
For reconstruction of the spatial structure of many-component objects, it is proposed to use multi-radiography with detection of X-ray by combined detector arrays using detectors of ``scintillator-photodiode'' type. A theoretical model has…