Related papers: A simple method for monitoring uniformity of epita…

Structural identifiability analysis of fractional-order equivalent circuit models (FO-ECMs), obtained through electrochemical impedance spectroscopy (EIS) is still a challenging problem. No peer-reviewed analytical or numerical proof does…

Micro-Electro-Mechanical Systems (MEMS) normally have fixed or moving structures with cross-sections of the order of microns ($\mu m$) and lengths of the order of tens or hundreds of microns. These structures are often plates or array of…

This paper presents a method for structural identifiability analysis of fractional order systems by using the coefficient mapping concept to determine whether the model parameters can uniquely be identified from input-output data. The…

In this work we develop a simple equivalent circuit model (ECM) that predicts the spectral response of a lumped-element loaded single patterned layer reflective metasurface. The proposed ECM maintains accuracy across varying design…

Modern bandgap engineered electronic devices are typically made of multi-semiconductor multi-layer heterostructures that pose a major challenge to silicon-era characterization methods. As a result, contemporary bandgap engineering relies…

A general description is given of a process of formation of an emf in a medium with nonequilibrium carriers. The appearance of anomalous emfs is predicted for several semiconductor structures. Such emfs appear as a result of photogeneration…

In this paper, we build an apparatus for measuring the optical transmittance and its uniformity for a semispherical surface at normal incidence; the system is primarily comprised of a traditional double-beam photometric framework and a…

We propose an experimental methodology for probing the energy barrier inhomogeneity at the metal/semiconductor interface without the need for time-consuming microscopic survey. It is based on the known statistical nature of the interfacial…

Variational level set method has become a powerful tool in image segmentation due to its ability to handle complex topological changes and maintain continuity and smoothness in the process of evolution. However its evolution process can be…

Linear optical circuits of growing complexity are playing an increasing role in emerging photonic quantum technologies. Individual photonic devices are typically described by a unitary matrix containing amplitude and phase information, the…

In this work we propose an efficient and accurate multi-scale optical simulation algorithm by applying a numerical version of slowly varying envelope approximation in FEM. Specifically, we employ the fast iterative method to quickly compute…

Band bending is a central concept in solid-state physics that arises from local variations in charge distribution especially near semiconductor interfaces and surfaces. Its precision measurement is vital in a variety of contexts from the…

A method is proposed for generating and discriminating Bell states of high fidelity from consecutive single-photons generated in a semiconductor quantum dot. The use of a non-symmetric beam splitter is found to be essential and sufficient,…

A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…

The visualization of pure phase objects by wavefront sensing has important applications ranging from surface profiling to biomedical microscopy, and generally requires bulky and complicated setups involving optical spatial filtering,…

Low-energy electron microscopy (LEEM) is a surface science method that works primarily in the UHV environment. It provides information complementary to the other established techniques: it extends the limited view of scanning probe…

This paper presents the consideration of the presence and the influence of non-linear distortion of photo-acoustic measurement set-up on the results of thermal properties analysis for the multi-layer semiconductor structure. The authors…

Scanning electron microscopy (SEM), a century-old technique, is today a ubiquitous method of imaging the surface of nanostructures. However, most SEM detectors simply count the number of secondary electrons from a material of interest, and…

Electrochemical impedance spectroscopy (EIS) is a widely used tool for characterization of fuel cells and other electrochemical conversion systems. When applied to the on-line monitoring in the context of in-field applications, the…

Precise control of the properties of semiconductor quantum dots (QDs) is vital for creating novel devices for quantum photonics and advanced opto-electronics. Suitable low QD-density for single QD devices and experiments are challenging to…