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Related papers: Quantitative analysis of ferroelectric domain imag…

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Piezoresponse Force Spectroscopy (PFS) is a powerful method widely used for measuring the nanoscale ferroelectric responses of the materials. However, it is found that certain non-ferroelectric materials can also generate similar responses…

Materials Science · Physics 2018-09-13 Yue Liu , Yao Sun , Wanheng Lu , Hongli Wang , Zhongting Wang , Bingxue Yu , Tao Li , Kaiyang Zeng

Ferroelectric materials have remained one of the foci of condensed matter physics and materials science for over 50 years. In the last 20 years, the development of voltage-modulated scanning probe microscopy techniques, exemplified by…

Materials Science · Physics 2017-01-06 Rama K. Vasudevan , Nina Balke , Peter Maksymovych , Stephen Jesse , Sergei V. Kalinin

Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. The magnetic domain structure of the sample depends on the…

Instrumentation and Detectors · Physics 2014-02-24 M. Schneiderbauer , F. J. Giessibl

Ongoing advances in scanning probe microscopy techniques are continually expanding the possibilities for nanoscale characterization and correlated studies of functional materials. Here, we demonstrate how a recent extension of piezoresponse…

Materials Science · Physics 2026-01-21 Ruben Dragland , Jan Schultheiß , Ivan N. Ushakov , Roger Proksch , Dennis Meier

Piezoresponse force microscopy (PFM) is a powerful tool widely used to characterize piezoelectricity and ferroelectricity at the nanoscale. However, it is necessary to distinguish microscopic mechanisms between piezoelectricity and…

Materials Science · Physics 2018-04-26 Junxi Yu , Ehsan Nasr Esfahani , Qingfeng Zhu , Dongliang Shan , Tingting Jia , Shuhong Xie , Jiangyu Li

At first sight piezoresponse force microscopy (PFM) seems an ideal technique for the determination of piezoelectric coefficients (PCs), thus making use of its ultra-high vertical resolution (<0.1 pm/V). Christman et al. \cite{Chr98} first…

Materials Science · Physics 2009-11-13 T. Jungk , A. Hoffmann. , E. Soergel

We explore the ferroic properties of methylammonium lead iodide perovskite solar cells by Piezoresponse Force Microscopy (PFM). In vertical and horizontal PFM imaging, we find domains of alternating polarization with a width of 90 nm which…

Materials Science · Physics 2026-05-11 Holger Röhm , Tobias Leonhard , Michael J. Hoffmann , Alexander Colsmann

Ferroelectric domain walls have emerged as one of the most fascinating objects in condensed matter physics due to the broad variability of functional behaviors they exhibit. However, the vast majority of domain walls studies have been…

The structure of a single antiparallel ferroelectric domain wall in LiNbO3 is quantitatively mapped by piezoelectric force microscopy (PFM) with calibrated probe geometry. The PFM measurements are performed for 49 probes with the radius…

Ferroelectric polarization switching underpins the functional performance of a wide range of materials and devices, yet its dependence on complex local microstructural features renders systematic exploration by manual or grid-based…

General energy approaches have been applied to study the single-domain polarization reversal induced by the voltage-modulated Atomic Force Microscopy (AFM) in ferroelectric single crystals and thin films. Topographic analysis of energy…

Materials Science · Physics 2009-11-10 A. Yu. Emelyanov

Strong coupling between electrical and mechanical phenomena and the presence of switchable polarization have enabled applications of ferroelectric materials for nonvolatile memories (FeRAM), data storage, and ferroelectric lithography.…

Frequency dependent dynamic behavior in Piezoresponse Force Microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analyzed using a combination of modeling and experimental measurements. The PFM signal comprises…

Materials Science · Physics 2015-06-25 Stephen Jesse , Arthur P. Baddorf , Sergei V. Kalinin

Surprising asymmetry in the local electromechanical response across a single antiparallel ferroelectric domain wall is reported. Piezoelectric force microscopy is used to investigate both the in-plane and out-of- plane electromechanical…

Materials Science · Physics 2009-11-11 David A. Scrymgeour , Venkatraman Gopalan

The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…

Imaging of magnetic domains with a photoelectron emission microscope operated with photon energies in the threshold regime often suffers from low contrast. In this work we show by symmetry considerations, photoemission calculations, and…

Materials Science · Physics 2025-07-22 F. O. Schumann , M. Paleschke , J. Henk , W. Widdra , C. -T. Chiang

In 2014, Charge Gradient Microscopy (CGM) was first reported as a new scanning probe imaging mode, particularly well-suited for the characterisation of ferroelectrics. The implementation of the technique is straightforward; it involves…

Domains walls and topological defects in ferroelectric materials have emerged as a powerful new paradigm for functional electronic devices including memory and logic. Similarly, wall interactions and dynamics underpin a broad range of…

Recently synthesized magnetic multilayers with strong perpendicular anisotropy exhibit unique magnetic properties including the formation of specific multidomain states. In particular, antiferromagnetically coupled multilayers own rich…

Mesoscale and Nanoscale Physics · Physics 2009-11-13 N. S. Kiselev , I. E. Dragunov , V. Neu , U. K. Roessler , A. N. Bogdanov

The nondestructive imaging of subsurface structures on the nanometer scale has been a long-standing desire in both science and industry. A few impressive images were published so far that demonstrate the general feasibility by combining…

Materials Science · Physics 2017-04-14 G. J. Verbiest , T. H. Oosterkamp , M. J. Rost