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Related papers: Phase determination in spin-polarized neutron spec…

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Recently it has been shown that the modules and phase of complex reflection coefficient can be determined by using a magnetic substrate and polarized neutrons. Several other methods have also been worked out based on measurement of…

Materials Science · Physics 2015-05-30 S. Farhad Masoudi , Saeed S. Jahromi

The determination of density profiles with knowing the phase information of complex reflection coefficient for neutron specularly reflected from a film, yields unique results. Recently it has been shown that the phase can be determined by…

Materials Science · Physics 2007-05-23 S. F. Masoudi , A. Pazirandeh , G. R. Jafari

An experimental method is proposed which allows the complete determination of the complex reflection coefficient for absorptive media for positive and negative values of the momenta. It makes use of magnetic reference layers and is a…

Condensed Matter · Physics 2009-10-31 H. Leeb , H. Groetz , J. Kasper , R. Lipperheide

A method is proposed which allows a complete determination of the complex reflection coefficient for any free unknown real potential (i.e., in the case where there is no effective absorption). In this method the unknown layer mounted on top…

Materials Science · Physics 2015-06-24 S. F. Masoudi , A. Pazirandeh

Magnetic domain walls in thin films can be well analyzed using polarized neutron reflectometry. Well defined streaks in the off-specular spin-flip scattering maps are explained by neutron refraction at perpendicular N\'{e}el walls. The…

Materials Science · Physics 2007-05-23 F. Radu , V. Leiner , K. Westerholt , H. Zabel , J. McCord , A. Vorobiev , J. Major , D. Jullien , H. Humblot , F. Tasset

Polarized neutron reflectometry (PNR) has long been applied to measure the magnetic depth profile of thin films. In recent years, interest has increased in observing lateral magnetic structures in a film. While magnetic arrays patterned by…

Mesoscale and Nanoscale Physics · Physics 2009-11-07 W. -T. Lee , S. G. E. te Velthuis , G. P. Felcher , F. Klose , T. Gredig , D. Dahlberg , B. V. Toperverg

By knowing the phase and modules of the reflection coefficient in neutron reflectometry problems, a unique result for the scattering length density (SLD) of a thin film can be determined which will lead to the exact determination of type…

Materials Science · Physics 2011-08-30 Saeed S. Jahromi , Seyed Farhad Masoudi

In the past decade, several neutron reflectometry methods for determining the modulus and phase of the complex reflection coefficient of an unknown multilayer thin film have been worked out among which the method of variation of…

Materials Science · Physics 2012-09-06 Seyed Farhad Masoudi , Saeed S. Jahromi

We have shown that polarized neutron reflectometry can determine in a model-free way not only the mean magnetization of a ferromagnetic thin film at any point of a hysteresis cycle, but also the mean square dispersion of the magnetization…

Materials Science · Physics 2009-11-07 W. -T. Lee , S. G. E. te Velthuis , G. P. Felcher , F. Klose , T. Gredig , E. D. Dahlberg

The presence of a large applied magnetic field removes the degeneracy of the vacuum energy states for spin-up and spin-down neutrons. For polarized neutron reflectometry, this must be included in the reference potential energy of the…

Polarized neutron reflectometry is a powerful technique to interrogate the structures of multilayered magnetic materials with depth sensitivity and nanometer resolution. However, reflectometry profiles often inhabit a complicated objective…

Using the general approach of Lax for multiple scattering of waves a 2x2 covariant expression for the reflectivity of polarized slow neutrons of a magnetic layer structure of arbitrary complexity is given including polarization effects of…

Other Condensed Matter · Physics 2015-03-04 L Deák , L. Bottyán , D. L. Nagy , H. Spiering

We studied the depth dependent magnetization profile of the magnetostrictive Co thin film layer in a PMN-PT (011)/Ta/Co/Ta structure under both zero and nonzero applied electric field using polarized neutron reflectometry. Application of…

Mesoscale and Nanoscale Physics · Physics 2019-04-02 Md Mamun Al-Rashid , Alexander Grutter , Brian Kirby , Jayasimha Atulasimha

Neutron reflectometry is a critical tool for investigating the structure of thin films and interfaces. However, the misapplication of the Born approximation to reflection geometry leads some to assume that the minimum thickness that may be…

Soft Condensed Matter · Physics 2024-03-21 Nicolas Shiaelis , Luke A. Clifton , Andrew R. McCluskey

We present and apply a new method to measure directly weak magnetization in thin films. The polarization of a neutron beam channeling through a thin film structure is measured after exiting the structure edge as a microbeam. We have applied…

Materials Science · Physics 2016-05-04 S. V. Kozhevnikov , Yu. N. Khaydukov , T. Keller , F. Ott , F. Radu

Neutron Zeeman spatial beam-splitting is considered at reflection from magnetically noncollinear films. Two applications of Zeeman beam-splitting phenomenon in polarized neutron reflectometry are discussed. One is the construction of…

Materials Science · Physics 2017-01-31 S. V. Kozhevnikov , V. K. Ignatovich , F. Radu

Reflection phase imaging provides label-free, high-resolution characterization of biological samples, typically using interferometric-based techniques. Here, we investigate reflection phase microscopy from intensity-only measurements under…

Quantitative Methods · Quantitative Biology 2019-12-18 Alex Matlock , Anne Sentenac , Patrick C. Chaumet , Ji Yi , Lei Tian

We investigate a method to directly measure the phase of a laser beam reflected from a metallic film after excitation of surface plasmon polaritons. This method permits real time access to the phase information, it increases the possible…

Optics · Physics 2015-05-19 T. König , M. Weidemüller , A. Hemmerich

We introduce the technique of Entangled-Beam Reflectometry for extracting spatially correlated (magnetic or non-magnetic) information from material surfaces or thin films. Our amplitude- and phase-sensitive technique exploits the coherent…

Optics · Physics 2024-01-23 Q. Le Thien , R. Pynn , G. Ortiz

The scattering properties of quantum particles on fractal potentials at different stages of fractal growth are obtained by means of the transfer matrix method. This approach can be easily adopted for project assignments in introductory…

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