Related papers: Advances in atomic force microscopy
Atomic time scale imaging, opening a new era for studying dynamics in microcosmos, is presently attracting immense research interesting on the global level due to its powerful ability. On the atom level, physics, chemistry, and biology are…
Opto-mechano-fluidic resonators (OMFRs) are a new platform for high-throughput sensing of the mechanical properties of freely flowing microparticles in arbitrary media. Experimental extraction of OMFR mode shapes, especially the acoustic…
Ultrasonic AFM may improve fabrication technologies on the nanometer scale. In the presence of ultrasonic vibration, hard surfaces can be indented and scratched with the tip of a soft cantilever, due to its inertia. Ultrasound reduces or…
The progress achieved in micro-fabricating potential for cold atoms has defined a new field in quantum technology - Atomtronics - where a variety of 'atom circuits' of very different spatial shapes and depth have been devised for atom…
Atomic force microscopes have proved to be fundamental research tools in many situations where a gentle imaging process is required, and in a variety of environmental conditions, such as the study of biological samples. Among the possible…
In the last decade, the development of Ultrafast Electron Diffraction (UED) and Microscopy (UEM) has enabled the imaging of atomic motion in real time and space. These pivotal table-top tools opened the door for a vast range of applications…
Currently, Atomic Force Microscopy (AFM) is the most preferred Scanning Probe Microscopy (SPM) method due to its numerous advantages. However, increasing the scanning speed and reducing the interaction forces between the probe's tip and the…
Measurements with an atomic force microscope (AFM) offer a direct way to probe elastic properties of lipid bilayer membranes locally: provided the underlying stress-strain relation is known, material parameters such as surface tension or…
We present Advancing Front Mapping (AFM), a provably robust algorithm for the computation of surface mappings to simple base domains. Given an input mesh and a convex or star-shaped target domain, AFM installs a (possibly refined) version…
Atomic Force Microscopy (AFM) is a suitable tool to perform tribological characterization of materials down to the nanometer scale. An important aspect in nanofriction measurements of corrugated samples is the local tilt of the surface,…
A method to measure the viscosity of liquids at microscales is presented. It uses a thin glass fiber fixed on the tip of the cantilever of an extremely low noise Atomic Force Microscope (AFM), which accurately measures the cantilever…
Atomic vibrations control all thermally activated processes in materials including diffusion, heat transport, phase transformations, and surface chemistry. Recent developments in monochromated, aberration-corrected scanning transmission…
Frequency modulation (FM) Atomic Force Microscopy (AFM) with metal tips functionalized with a CO molecule at the tip apex has provided access to the internal structure of molecules with totally unprecedented resolution. We propose a model…
Small oscillation amplitudes in dynamic atomic force microscopy can lead to invasive and high resolution imaging. Here we discuss small oscillation amplitude imaging in the context of ambient conditions and simultaneously excite the second…
In this paper we present a new machine learning workflow with unsupervised learning techniques to identify domains within atomic force microscopy images obtained from polymer films. The goal of the workflow is to identify the spatial…
In the short letter, we explain an improved transform theory for colloidal-probe atomic force microscopy (CP-AFM). CP-AFM can measure a force curve between the colloidal probe and a wall surface in a colloidal dispersion. The transform…
Atomic force microscopes (AFMs) are ubiquitous in research laboratories and have recently been priced for use in teaching laboratories. Here we review several AFM platforms (Dimension 3000 by Digital Instruments, EasyScan2 by Nanosurf,…
Atomic force microscopy (AFM) is a powerful tool to investigate interaction forces at the micro and nanoscale. Cantilever stiffness, dimensions and geometry of the tip can be chosen according to the requirements of the specific application,…
Numerous cell types relate to their immediate environment by exerting a three-dimensional pressure field on their environment, with components both longitudinal and transverse to the cell membrane. This pressure field can in principle be…
We demonstrate the measurement of laterally induced optical forces using an Atomic Force Microscope (AFM). The lateral electric field distribution between a gold coated AFM probe and a nano-aperture in a gold film is mapped by measuring the…