Related papers: Building Reliable Arithmetic Multipliers Under NBT…

Memory designs require timing margins to compensate for aging and fabrication process variations. With technology downscaling, aging mechanisms became more apparent, and larger margins are considered necessary. This, in return, means a…

The dependability of AI models relies largely on the reliability of the underlying computation hardware. Hardware aging attacks can compromise the computing substrate and disrupt AI models over the long run. In this work, we present a new…

Resource balancing has been effectively used to mitigate the long-term aging effects of Negative Bias Temperature Instability (NBTI) in multi-core and Graphics Processing Unit (GPU) architectures. In this work, we investigate this strategy…

Matrix multiplication is a fundamental operation in both training of neural networks and inference. To accelerate matrix multiplication, Graphical Processing Units (GPUs) provide it implemented in hardware. Due to the increased throughput…

Reliability has become an increasing concern in modern computing. Integrated circuits (ICs) are the backbone of modern computing devices across industries, including artificial intelligence (AI), consumer electronics, healthcare,…

Negative Biased Temperature Instability (NBTI)-induced aging is one of the critical reliability threats in nano-scale devices. This paper makes the first attempt to study the NBTI aging in the on-chip weight memories of deep neural network…

Hardware failures are a growing challenge for machine learning accelerators, many of which are based on systolic arrays. When a permanent hardware failure occurs in a systolic array, existing solutions include localizing and isolating the…

Approximate computing is a promising approach to reduce the power, delay, and area in hardware design for many error-resilient applications such as machine learning (ML) and digital signal processing (DSP) systems, in which multipliers…

Ootomo, Ozaki, and Yokota [Int. J. High Perform. Comput. Appl., 38 (2024), p. 297-313] have proposed a strategy to recast a floating-point matrix multiplication in terms of integer matrix products. The factors A and B are split into integer…

This paper presents OptGM, an optimized gate merging method designed to mitigate negative bias temperature instability (NBTI) in digital circuits. First, the proposed approach effectively identifies NBTI-critical internal nodes, defined as…

Transistor aging is one of the major concerns that challenges designers in advanced technologies. It profoundly degrades the reliability of circuits during its lifetime as it slows down transistors resulting in errors due to timing…

Burn-in is accepted as a way to evaluate ageing effects in an accelerated manner. It has been suggested that burn-in stress may have a significant effect on the Negative Bias Temperature Instability (NBTI) of subthreshold CMOS circuits.…

Neural Networks (NNs) have been widely adopted due to their outstanding efficacy and adaptability across computer vision and deep learning applications. The optimization of NNs is necessary to enable their deployment on energy constrained…

The recent emergence of novel computational devices, such as adiabatic quantum computers, CMOS annealers, and optical parametric oscillators, present new opportunities for hybrid-optimization algorithms that are hardware accelerated by…

Memristive Processing In-Memory (PIM) is one of the promising techniques for overcoming the Von-Neumann bottleneck. Reduction of data transfer between processor and memory and data processing by memristors in data-intensive applications…

Recently, the demand of low-power deep-learning hardware for industrial applications has been increasing. Most existing artificial intelligence (AI) chips have evolved to rely on new chip technologies rather than on radically new hardware…

This paper presents a novel circuit (AID) to improve the accuracy of an energy-efficient in-memory multiplier using a standard 6T-SRAM. The state-of-the-art discharge-based in-SRAM multiplication accelerators suffer from a non-linear…

Transistor aging phenomena manifest themselves as degradations in the main electrical characteristics of transistors. Over time, they result in a significant increase of cell propagation delay, leading to errors due to timing violations,…

Electronic devices primarily aim to offer low power consumption, high speed, and a compact area. The performance of very large-scale integration (VLSI) devices is influenced by arithmetic operations, where multiplication is a crucial…

Reliability is a crucial requirement in any modern microprocessor to assure correct execution over its lifetime. As mission critical components are becoming common in commodity systems; e.g., control of autonomous cars, the demand for…