Related papers: TrueEBSD in MTEX: automatic image matching for cor…
The ability to characterise the three-dimensional microstructure of multiphase materials is essential for understanding the interaction between phases and associated materials properties. Here, laboratory-based diffraction-contrast…
The deep-learning based image matching networks can now handle significantly larger variations in viewpoints and illuminations while providing matched pairs of pixels with sub-pixel precision. These networks have been trained with…
Limited-angle electron tomography aims to reconstruct 3D shapes from 2D projections of Transmission Electron Microscopy (TEM) within a restricted range and number of tilting angles, but it suffers from the missing-wedge problem that causes…
We demonstrate a multi-beam scanning transmission electron microscopy (STEM) imaging that integrates down-sampling with super-resolution image reconstruction via a compressive sensing framework. A custom condenser aperture with six randomly…
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a…
Microsimulation models (MSMs) are used to predict population-level effects of health care policies by simulating individual-level outcomes. Simulated outcomes are governed by unknown parameters that are chosen so that the model accurately…
In this paper we propose a modified cross correlation method to align images from the same class in single-particle electron microscopy of highly non-spherical structures. In this new method, First we coarsely align projection images, and…
A global threshold (e.g., 0.5) is often applied to determine which bounding boxes should be included in the final results for an object detection task. A higher threshold reduces false positives but may result in missing a significant…
We present MIX'EM, a novel solution for unsupervised image classification. MIX'EM generates representations that by themselves are sufficient to drive a general-purpose clustering algorithm to deliver high-quality classification. This is…
In this work, we develop methods for few-shot image classification from a new perspective of optimal matching between image regions. We employ the Earth Mover's Distance (EMD) as a metric to compute a structural distance between dense image…
Gathering 3D material microstructural information is time-consuming, expensive, and energy-intensive. Acquisition of 3D data has been accelerated by developments in serial sectioning instrument capabilities; however, for crystallographic…
Perhaps surprisingly, the total electron microscopy (EM) data collected to date is less than a cubic millimeter. Consequently, there is an enormous demand in the materials and biological sciences to image at greater speed and lower dosage,…
Distributed stochastic optimization algorithms can simultaneously process large-scale datasets, significantly accelerating model training. However, their effectiveness is often hindered by the sparsity of distributed networks and data…
The objective of this paper is to design an embedding method that maps local features describing an image (e.g. SIFT) to a higher dimensional representation useful for the image retrieval problem. First, motivated by the relationship…
A multi-scale approach to the inverse reconstruction of a pattern's microstructure is reported. Instead of a correlation function, a pair of entropic descriptors (EDs) is proposed for stochastic optimization method. The first of them…
We present an open source software package SpectroLab a Matlab-based tool developed in 2018 for the analysis of spectroscopic data. In this package, there are tools for derivative analysis, stacked energy contours, stacked plots for theory,…
PET requires accurate, precise, and efficient scatter correction techniques. Conventional scatter estimation typically relies on tail-fitted single-scatter simulation (SSS) strategy. However, the accuracy of tail-fitted SSS is limited, for…
Materials characterization using electron backscatter diffraction (EBSD) requires indexing the orientation of the measured region from Kikuchi patterns. The quality of Kikuchi patterns can degrade due to pattern overlaps arising from two or…
The three scanning electron microscope diffraction based techniques of electron channelling patterns (ECPs), electron channelling contrast imaging (ECCI), and electron back scatter diffraction (EBSD) are reviewed. The dynamical diffraction…
High-throughput 2D and 3D scanning electron microscopy, which relies on automation and dependable control algorithms, requires high image quality with minimal human intervention. Classical focus and astigmatism correction algorithms attempt…