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Deep learning is now the gold standard in computer vision-based quality inspection systems. In order to detect defects, supervised learning is often utilized, but necessitates a large amount of annotated images, which can be costly:…

Computer Vision and Pattern Recognition · Computer Science 2021-07-23 Pierre Gutierrez , Maria Luschkova , Antoine Cordier , Mustafa Shukor , Mona Schappert , Tim Dahmen

Utility companies increasingly rely on drone imagery for post-event and routine inspection, but training accurate defect-type classifiers remains difficult because defect examples are rare and inspection datasets are often limited or…

Computer Vision and Pattern Recognition · Computer Science 2026-03-10 Xuesong Wang , Caisheng Wang

Synthetic dataset generation in Computer Vision, particularly for industrial applications, is still underexplored. Industrial defect segmentation, for instance, requires highly accurate labels, yet acquiring such data is costly and…

Computer Vision and Pattern Recognition · Computer Science 2026-01-28 Emanuele Caruso , Alessandro Simoni , Francesco Pelosin

Deep-learning methods have recently started being employed for addressing surface-defect detection problems in industrial quality control. However, with a large amount of data needed for learning, often requiring high-precision labels, many…

Computer Vision and Pattern Recognition · Computer Science 2021-04-21 Jakob Božič , Domen Tabernik , Danijel Skočaj

An insufficient number of training samples is a common problem in neural network applications. While data augmentation methods require at least a minimum number of samples, we propose a novel, rendering-based pipeline for synthesizing…

Computer Vision and Pattern Recognition · Computer Science 2022-09-30 Andreas Spruck , Maximilane Gruber , Anatol Maier , Denise Moussa , Jürgen Seiler , Christian Riess , André Kaup

Defect segmentation is crucial for quality control in advanced manufacturing, yet data scarcity poses challenges for state-of-the-art supervised deep learning. Synthetic defect data generation is a popular approach for mitigating data…

Computer Vision and Pattern Recognition · Computer Science 2024-10-25 Shancong Mou , Raviteja Vemulapalli , Shiyu Li , Yuxuan Liu , C Thomas , Meng Cao , Haoping Bai , Oncel Tuzel , Ping Huang , Jiulong Shan , Jianjun Shi

Machine learning, particularly deep learning, is transforming industrial quality inspection. Yet, training robust machine learning models typically requires large volumes of high-quality labeled data, which are expensive, time-consuming,…

Computer Vision and Pattern Recognition · Computer Science 2026-05-26 Ruo-Syuan Mei , Sixian Jia , Guangze Li , Soo Yeon Lee , Brian Musser , William Keller , Sreten Zakula , Jorge Arinez , Chenhui Shao

Quality control of assembly processes is essential in manufacturing to ensure not only the quality of individual components but also their proper integration into the final product. To assist in this matter, automated assembly control using…

Computer Vision and Pattern Recognition · Computer Science 2025-09-17 Jonas Werheid , Shengjie He , Aymen Gannouni , Anas Abdelrazeq , Robert H. Schmitt

The use of machine learning (ML) methods for development of robust and flexible visual inspection system has shown promising. However their performance is highly dependent on the amount and diversity of training data. This is often…

Computer Vision and Pattern Recognition · Computer Science 2024-10-22 Juraj Fulir , Natascha Jeziorski , Lovro Bosnar , Hans Hagen , Claudia Redenbach , Petra Gospodnetić , Tobias Herrfurth , Marcus Trost , Thomas Gischkat

In industrial manufacturing, deploying deep learning models for visual inspection is mostly hindered by the high and often intractable cost of collecting and annotating large-scale training datasets. While image synthesis from 3D CAD models…

Computer Vision and Pattern Recognition · Computer Science 2025-12-30 Nico Baumgart , Markus Lange-Hegermann , Mike Mücke

The availability of large image data sets has been a crucial factor in the success of deep learning-based classification and detection methods. While data sets for everyday objects are widely available, data for specific industrial…

Computer Vision and Pattern Recognition · Computer Science 2019-09-25 Matthew Z. Wong , Kiyohito Kunii , Max Baylis , Wai Hong Ong , Pavel Kroupa , Swen Koller

The aim of this study is to investigate an automated industrial manipulation pipeline, where assembly tasks can be flexibly adapted to production without the need for a robotic expert, both for the vision system and the robot program. The…

Robotics · Computer Science 2024-04-02 Alireza Barekatain , Hamed Rahimi Nohooji , Holger Voos

Industrial visual inspection systems often suffer from a severe scarcity of labeled defect data, particularly during the early stages of New Product Introduction (NPI). This limitation hinders the deployment of robust supervised detectors…

Computer Vision and Pattern Recognition · Computer Science 2026-04-28 Serkan Hamdi Güğül , Kemal Levi , Burak Acar

Synthetic data is widely adopted in embedding models to ensure diversity in training data distributions across dimensions such as difficulty, length, and language. However, existing prompt-based synthesis methods struggle to capture…

Computation and Language · Computer Science 2025-12-05 Haoran Li , Zhiming Su , Junyan Yao , Enwei Zhang , Yang Ji , Yan Chen , Kan Zhou , Chao Feng , Jiao Ran

Large-scale Vision-Language Models (VLMs) have transformed general-purpose visual recognition through strong zero-shot capabilities. However, their performance degrades significantly in niche, safety-critical domains such as industrial…

Computer Vision and Pattern Recognition · Computer Science 2026-04-23 Aaditya Baranwal , Abdul Mueez , Jason Voelker , Guneet Bhatia , Shruti Vyas

Deep learning in computer vision has achieved great success with the price of large-scale labeled training data. However, exhaustive data annotation is impracticable for each task of all domains of interest, due to high labor costs and…

Computer Vision and Pattern Recognition · Computer Science 2023-05-26 Hui Tang , Kui Jia

Surface defect detection is a critical task across numerous industries, aimed at efficiently identifying and localising imperfections or irregularities on manufactured components. While numerous methods have been proposed, many fail to meet…

Computer Vision and Pattern Recognition · Computer Science 2025-10-20 Blaž Rolih , Matic Fučka , Danijel Skočaj

While modern Requirements Engineering (RE) heavily relies on natural language processing and Machine Learning (ML) techniques, their effectiveness is limited by the scarcity of high-quality datasets. This paper introduces Synthline, a…

Software Engineering · Computer Science 2025-05-07 Abdelkarim El-Hajjami , Camille Salinesi

Substation meters play a critical role in monitoring and ensuring the stable operation of power grids, yet their detection of cracks and other physical defects is often hampered by a severe scarcity of annotated samples. To address this…

Computer Vision and Pattern Recognition · Computer Science 2026-01-15 Jackie Alex , Justin Petter

Training supervised deep neural networks that perform defect detection and segmentation requires large-scale fully-annotated datasets, which can be hard or even impossible to obtain in industrial environments. Generative AI offers…

Computer Vision and Pattern Recognition · Computer Science 2024-01-09 Gabriele Valvano , Antonino Agostino , Giovanni De Magistris , Antonino Graziano , Giacomo Veneri
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