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Electron backscatter diffraction (EBSD) in the scanning electron microscope is routinely used for microstructural characterisation of polycrystalline materials. Maps of EBSD data are typically acquired at high stage tilt and slow scan…
MRI is increasingly desired to function near electronic devices that emit potentially dynamic electromagnetic interference (EMI). To accommodate for this, we propose the STRIDE method, which improves on previous external-sensor-based EMI…
(Mini-batch) Stochastic Gradient Descent is a popular optimization method which has been applied to many machine learning applications. But a rather high variance introduced by the stochastic gradient in each step may slow down the…
Accurate multi-slice reconstruction from limited measurement data is crucial to speed up the acquisition process in medical and scientific imaging. However, it remains challenging due to the ill-posed nature of the problem and the high…
A new method for dark field imaging is introduced which uses scanned electron diffraction (or 4DSTEM - 4-dimensional scanning transmission electron microscopy) datasets as its input. Instead of working on simple summation of intensity, it…
The resolution of optical imaging is classically limited by the width of the point-spread function, which in turn is determined by the Rayleigh length. Recently, spatial-mode demultiplexing (SPADE) has been proposed as a method to achieve…
Features based on sparse representation, especially using the synthesis dictionary model, have been heavily exploited in signal processing and computer vision. However, synthesis dictionary learning typically involves NP-hard sparse coding…
Compressed sensing can decrease scanning transmission electron microscopy electron dose and scan time with minimal information loss. Traditionally, sparse scans used in compressed sensing sample a static set of probing locations. However,…
Concept drift -- the change of the distribution over time -- poses significant challenges for learning systems and is of central interest for monitoring. Understanding drift is thus paramount, and drift localization -- determining which…
The highly energetic electrons in a transmission electron microscope (TEM) can alter or even completely destroy the structure of samples before sufficient information can be obtained. This is especially problematic in the case of zeolites,…
An imaging technique with sensitivity to short duration optical transients is described. The technique is based on the use of wide-field cameras operating in a drift scanning mode, whereby persistent objects produce trails on the sensor and…
Digital watermarking techniques are essential to prevent unauthorized use of images. Since pirated images are often geometrically distorted by operations such as scaling and cropping, accurate synchronization - detecting the embedding…
Subsampling and fast scanning in the scanning transmission electron microscope is problematic due to scan coil hysteresis - the mismatch between the actual and assumed location of the electron probe beam as a function of the history of the…
Semantic Image Segmentation facilitates a multitude of real-world applications ranging from autonomous driving over industrial process supervision to vision aids for human beings. These models are usually trained in a supervised fashion…
Previous attempts to integrate Neural Radiance Fields (NeRF) into the Simultaneous Localization and Mapping (SLAM) framework either rely on the assumption of static scenes or require the ground truth camera poses, which impedes their…
Video dataset condensation aims to reduce the immense computational cost of video processing. However, it faces a fundamental challenge regarding the inseparable interdependence between spatial appearance and temporal dynamics. Prior work…
In this paper we provide a thorough, rigorous theoretical framework to assess optimality guarantees of sampling-based algorithms for drift control systems: systems that, loosely speaking, can not stop instantaneously due to momentum. We…
Crystalline defects, such as line-like dislocations, play an important role for the performance and reliability of many metallic devices. Their interaction and evolution still poses a multitude of open questions to materials science and…
Understanding elementary mechanisms behind solid-state phase transformations and reactions is the key to optimizing desired functional properties of many technologically relevant materials. Recent advances in scanning transmission electron…
Controlling crystalline material defects is crucial, as they affect properties of the material that may be detrimental or beneficial for the final performance of a device. Defect analysis on the sub-nanometer scale is enabled by…