Related papers: UV-enhanced SEM: towards orientation and electron …
Scanning electron microscopy (SEM) is a versatile technique used to image samples at the nanoscale. Conventional imaging by this technique relies on finding the average intensity of the signal generated on a detector by secondary electrons…
We demonstrate high resolution extreme ultraviolet (EUV) coherent diffractive imaging in the most general reflection geometry by combining ptychography with tilted plane correction. This method makes it possible to image extended surfaces…
A solid-state organic thin-film laser with intracavity frequency doubling is reported. Tunable ultraviolet emission from 309 to 322 nm is achieved from a vertical external cavity surface-emitting organic laser, with 2 % efficiency (1 $\mu$J…
Controlled interaction of laser light with electron beams is fundamental for ultrafast electron microscopy and electron-based quantum optics, yet their direct coupling is forbidden in free space. Here we use longitudinally polarized light…
The dynamics of photo-excited charge carriers, particularly their transport and interactions with defects and interfaces, play an essential role in determining the performance of a wide range of solar and optoelectronic devices. A thorough…
Atomic resolution imaging in transmission electron microscopy (TEM) and scanning TEM (STEM) of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered when…
Chip-based Evanescent Light Scattering (cELS) utilizes the multiple modes of a high-index contrast optical waveguide for near-field illumination of unlabeled samples, thereby repositioning the highest spatial frequencies of the sample into…
Polarized wavelength-tunable electroluminescence (EL) represents a critical on-demand functionality for next-generation optoelectronics. While conventional van der Waals (vdW) EL devices offer discrete wavelength switching constrained by…
The JEM-EUSO program is focused on observations of Ultra High Energy Cosmic Rays (UHECRs) from space. For this purpose, a series of detectors based on multi-anode photomultiplier tubes with a time resolution of the order of $\mu$s have been…
Strain engineering in semiconductor transistor devices has become vital in the semiconductor industry due to the ever increasing need for performance enhancement at the nanoscale. Raman spectroscopy is a non-invasive measurement technique…
For the first time a vertically polarized electron beam has been used for physics experiments at MAMI in the energy range between 180 and 855 MeV. The beam-normal single-spin asymmetry $A_{\mathrm{n}}$, which is a direct probe of…
The adaptive module of the 4.1-m SOAR telescope, SAM, corrects ground-layer turbulence using a UV laser guide star. It has been commissioned in 2013 and it is in regular science operation since 2014. SAM works with the CCD imager covering a…
Interfacing electrons and light enables ultrafast electron microscopy, quantum control of electrons, as well as new optical elements for high sensitivity imaging. Here we demonstrate for the first time programmable transverse electron beam…
The idea of implementing electroluminescence-based amplification through transparent multi-hole structures (FAT-GEMs) has been entertained for some time. Arguably, for such a technology to be attractive it should perform at least at a level…
We demonstrate room-temperature electroluminescence (EL) from light-emitting diodes (LED) on highly strained germanium (Ge) membranes. An external stressor technique was employed to introduce a 0.76% bi-axial tensile strain in the active…
Independently from electron beam based procedures, photon beam based diagnostics is an alternative way for alignment and commissioning of the numerous undulator cells in a high-gain short-wavelength free-electron laser (FEL). In this paper,…
The degree of entanglement of an electron with a hole in a vertically coupled self-assembled dot molecule is shown to be tunable by an external electric field. Using atomistic pseudopotential calculations followed by a configuration…
Recent studies of secondary electron (SE) emission in scanning transmission electron microscopes suggest that material's properties such as electrical conductivity, connectivity, and work function can be probed with atomic scale resolution…
Electric field enhancement mediated through sharp tips in scattering-type scanning near-field optical microscopy (s-SNOM) enables optical material analysis down to the 10-nm length scale, and even below. Nevertheless, mostly the…
Tunable polarization over a wide spectral range is a required feature of light sources employed to investigate the properties of local symmetry in both condensed and low-density matter. Among new-generation sources, free-electron lasers…