Related papers: Inference-Sufficient Representations for High-Thro…
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a…
Because of the vast volume of data being produced by today's scientific simulations, lossy compression allowing user-controlled information loss can significantly reduce the data size and the I/O burden. However, for large-scale cosmology…
Four-dimensional scanning transmission electron microscopy (4D-STEM) enables mapping of diffraction information with nanometer-scale spatial resolution, offering detailed insight into local structure, orientation, and strain. However, as…
Error-bounded lossy compression has been effective in significantly reducing the data storage/transfer burden while preserving the reconstructed data fidelity very well. Many error-bounded lossy compressors have been developed for a wide…
We consider a novel lossy compression approach based on unconditional diffusion generative models, which we call DiffC. Unlike modern compression schemes which rely on transform coding and quantization to restrict the transmitted…
Error-bounded lossy compression has been identified as a promising solution for significantly reducing scientific data volumes upon users' requirements on data distortion. For the existing scientific error-bounded lossy compressors, some of…
Development in lattice strain mapping using four-dimensional scanning transmission electron microscopy (4D-STEM) method now offers improved precision and feasibility. However, automatic and accurate diffraction analysis is still challenging…
As high-performance computing architectures evolve, more scientific computing workflows are being deployed on advanced computing platforms such as GPUs. These workflows can produce raw data at extremely high throughputs, requiring urgent…
The rapid growth of digital data has heightened the demand for efficient lossless compression methods. However, existing algorithms exhibit trade-offs: some achieve high compression ratios, others excel in encoding or decoding speed, and…
With ever-increasing volumes of scientific data produced by HPC applications, significantly reducing data size is critical because of limited capacity of storage space and potential bottlenecks on I/O or networks in writing/reading or…
Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with electron scattering simulations. However, using the…
Recently it has been shown that precise dose control and an increase in the overall acquisition speed of atomic resolution scanning transmission electron microscope (STEM) images can be achieved by acquiring only a small fraction of the…
Today's scientific high performance computing (HPC) applications or advanced instruments are producing vast volumes of data across a wide range of domains, which introduces a serious burden on data transfer and storage. Error-bounded lossy…
Compression is a crucial solution for data reduction in modern scientific applications due to the exponential growth of data from simulations, experiments, and observations. Compression with progressive retrieval capability allows users to…
Fine-grained sparsity promises higher parametric capacity without proportional per-token compute, but often suffers from training instability, load balancing, and communication overhead. We introduce STEM (Scaling Transformers with…
Linear phase-contrast scanning transmission electron microscopy (STEM) techniques compatible with high-throughput 4D-STEM acquisition are widely used to enhance phase contrast in weakly scattering and beam-sensitive materials. In these…
We demonstrate high accuracy classification for handwritten digits from the MNIST dataset ($\sim$98.00$\%$) and RGB images from the CIFAR-10 dataset ($\sim$86.80$\%$) by using resistive memories based on a 2D van-der-Waals semiconductor:…
Scientific discoveries are increasingly constrained by limited storage space and I/O capacities. For time-series simulations and experiments, their data often need to be decimated over timesteps to accommodate storage and I/O limitations.…
Nanoscale strain mapping by four-dimensional scanning transmission electron microscopy (4D-STEM) relies on determining the precise locations of Bragg-scattered electrons in a sequence of diffraction patterns, a task which is complicated by…
Characterizing long-range electric fields and built-in potentials in functional materials at nano- to micrometer scales is of supreme importance for optimizing devices. E.g., the functionality of semiconductor heterostructures or battery…