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Diffraction pattern analysis can be used to reveal the crystalline structure of materials, and this information is used to nano- and micro-structure of advanced engineering materials that enable modern life. For nano-structured materials…

Materials Science · Physics 2023-12-13 Tianbi Zhang , T. Ben Britton

The intricate fine structure of Kikuchi diffraction plays a vital role in probing phase transformations and strain distributions in functional materials, particularly in electron microscopy. Beyond these applications, it also proves…

Recent advances in scanning electron microscope (SEM) based Kikuchi diffraction have demonstrated the important potential for reflection and transmission methods, like transmission Kikuchi diffraction (TKD) and electron backscatter…

Materials Science · Physics 2025-02-21 Tianbi Zhang , Lukas Berners , Jakub Holzer , T. Ben Britton

In the technique of Electron Backscatter Diffraction (EBSD), the accurate detection and identification of different phases existing in a sample is often limited by overlapping Kikuchi diffraction patterns originating from the extended…

Materials Science · Physics 2026-01-23 Grzegorz Cios , Aimo Winkelmann , Tomasz Tokarski , Wiktor Bednarczyk , Piotr Bała

Electron Backscatter Diffraction (EBSD) is a technique to obtain microcrystallographic information from materials by collecting large-angle Kikuchi patterns in the scanning electron microscope (SEM). An important fundamental question…

Materials Science · Physics 2019-03-06 Aimo Winkelmann , T. Ben Britton , Gert Nolze

We present a methodology for in situ Transmission Kikuchi Diffraction (TKD) tensile testing that enables nanoscale characterization of the evolution of complex plasticity mechanisms. By integrating a modified in situ scanning electron…

Materials Science · Physics 2025-02-18 Tijmen Vermeij , Amit Sharma , Douglas Steinbach , Jun Lou , Johann Michler , Xavier Maeder

We summarize a data analysis approach for electron backscatter diffraction (EBSD) which uses high-resolution Kikuchi pattern simulations to measure isochoric relative deformation gradient tensors from experimentally measured Kikuchi…

We describe a lattice-based crystallographic approximation for the analysis of distorted crystal structures via Electron Backscatter Diffraction (EBSD) in the scanning electron microscope. EBSD patterns are closely linked to local lattice…

Materials Science · Physics 2019-01-02 Aimo Winkelmann , Gert Nolze , Grzegorz Cios , Tomasz Tokarski

The study of thin films and 2D materials, including transition metal dichalcogenides such as WSe$_2$ offers opportunities to leverage their properties in advanced sensors, quantum technologies, and device to optimize functional performance.…

Measuring local chemistry of specific crystallographic features by atom probe tomography (APT) is facilitated by using transmission Kikuchi diffraction (TKD) to help position them sufficiently close to the apex of the needle-shaped…

Materials Science · Physics 2023-04-04 Baptiste Gault , Heena Khanchandani , T. S. Prithiv , Stoichko Antonov , T. Ben Britton

Electronic devices are engineered at increasingly smaller length scales; new metrologies to understand nanoscale thermodynamics are needed. Temperature and pressure are fundamental thermodynamic quantities whose nanoscale measurement is…

Mesoscale and Nanoscale Physics · Physics 2025-10-24 Yueyun Chen , Xin Yi Ling , Jared Lodico , Tristan P. O`Neill , B. C. Regan , Matthew Mecklenburg

We describe a general method to determine the location of a point source of waves relative to a two-dimensional active pixel detector. Based on the inherent structural sensitivity of crystalline sensor materials, characteristic detector…

Instrumentation and Detectors · Physics 2017-04-26 Stefano Vespucci , Carol Trager-Cowan , Dzmitry Maneuski , Val O'Shea , Aimo Winkelmann

Orientation determination does not necessarily require complete knowledge of the local atomic arrangement in a material. We present a method for microstructural phase discrimination and orientation analysis of phases for which there is only…

Materials Science · Physics 2019-06-06 Aimo Winkelmann , Grzegorz Cios , Tomasz Tokarski , Gert Nolze , Ralf Hielscher , Tomasz Kocieł

The Kikuchi bands arise from Bragg diffraction of incoherent electrons scattered within a crystalline specimen and can be observed in both the transmission and reflection modes of scanning electron microscopy (SEM). Converging, rocking, or…

Electron back-scatter diffraction (EBSD) has traditionally relied upon methods such as the Hough transform and dictionary Indexing to interpret diffraction patterns and extract crystallographic orientation. However, these methods encounter…

Materials Science · Physics 2025-11-04 Meghraj Prajapat , Alankar Alankar

Electron backscatter diffraction is one of the most prevalent techniques used for microstructural characterization. In recent years, there has been an increase in the use of data-driven methods to analyze raw Kikuchi patterns. However, most…

Materials Science · Physics 2026-01-21 Qi Zhang , Santiago Benito , Sebastian Weber , Markus Stricker

Addressing the need for efficient and integrated multiscale crystallographic and defect analyses of advanced materials, this paper presents the implementation of a new multi-configuration detection system, integrating a single…

Instrumentation and Detectors · Physics 2026-05-19 Nohayla El-Khairaoui , Julien Guyon , Nathalie Gey , Luc Morhain , Nabila Maloufi

Two phase titanium alloys are important for high performance engineering components, such as aeroengine discs. The microstructures of these alloys are tailored during thermomechanical processing to precisely control phase factions,…

Materials Science · Physics 2017-04-05 Vivian Tong , Sudha Joseph , Abigail K. Ackerman , David Dye , T. Ben Britton

In this paper, we have analysed the depth resolution that can be achieved by on-axis transmission Kikuchi diffraction (TKD) using a Zr-Nb alloy. The results indicate that the signals contributing to detectable Kikuchi bands originate from a…

Materials Science · Physics 2019-06-24 Junliang Liu , Sergio Lozano-Perez , Angus J. Wilkinson , Chris R. M. Grovenor

A monolithic active pixel sensor based direct detector that is optimized for the primary beam energies in scanning electron microscopes is implemented for electron back-scattered diffraction (EBSD) applications. The high detection…

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