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Scanning Probe Microscopy (SPM) is the primary tool for exploring nanoscale functionality, yet standard single-frequency operation is fundamentally limited, because the dynamic tip-sample interaction is mathematically underdetermined. While…
Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher voltages. To improve resolution, spherical aberration can be…
This work presents an efficient algorithm for generating statistically representative microstructures of particulate composites in periodic representative volume elements. The Swelling and Random Migration (SRM) algorithm combines…
A new scaling law model for propagation of optical beams through atmospheric turbulence is presented and compared to a common scalar stochastic waveoptics technique. This methodology tracks the evolution of the important beam wavefront and…
Searches for impulsive, astrophysical transients are often highly computationally demanding. A notable example is the dedispersion process required for performing blind searches for Fast Radio Bursts (FRBs) in radio telescope data. We…
We introduce SPRING, a novel stochastic proximal alternating linearized minimization algorithm for solving a class of non-smooth and non-convex optimization problems. Large-scale imaging problems are becoming increasingly prevalent due to…
The spectral numerical mode-matching (SNMM) method is developed to simulate the 3D layered multi-region structures. The SNMM method is a semi-analytical solver having the properties of dimensionality reduction to reduce computational costs;…
A novel application of machine-learning (ML) based image processing algorithms is proposed to analyze an all-sky map (ASM) obtained using the Fermi Gamma-ray Space Telescope. An attempt was made to simulate a one-year ASM from a…
Imaging dynamical processes at interfaces and on the nanoscale is of great importance throughout science and technology. While light-optical imaging techniques often cannot provide the necessary spatial resolution, electron-optical…
We describe and evaluate a numerical solution strategy for simulating surface acoustic waves through semiconductor devices with complex geometries. This multi-physics problem is of particular relevance to the design of quantum electronic…
Analytical electron microscopy and spectroscopy of biological specimens, polymers, and other beam sensitive materials has been a challenging area due to irradiation damage. There is a pressing need to develop novel imaging and spectroscopic…
Extensions of the split-step Fourier method (SSFM) for Schr\"odinger-type pulse propagation equations for simulating femto-second pulses in single- and two-mode optical communication fibers are developed and tested for Gaussian pulses. The…
While transmission electron microscopes (TEM) can achieve a much higher resolution than optical microscopes, they face challenges of damage to samples during the high energy processes involved. Here, we explore using computational ghost…
This paper concerns an application of the orthogonality sampling method (OSM) for a real-time identification of small objects from two-dimensional Fresnel experimental dataset in transverse electric polarization. First, we apply the OSM…
The lensless endoscope is a promising device designed to image tissues in vivo at the cellular scale. The traditional acquisition setup consists in raster scanning during which the focused light beam from the optical fiber illuminates…
The Scanning electron microscope (SEM) and Electron-Dispersive Spectroscope (EDS) are two highly effective instruments in the field of nanoscience and nanotechnology. The quality of these instruments is determined by various factors, with…
Making material experiments more efficient is a high priority for materials scientists who seek to discover new materials with desirable properties. In this paper, we investigate how to optimize the laborious sequential measurements of…
Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an essential tool in understanding materials at the atomic scale. However, tuning the aberration corrector to produce a sub-{\AA}ngstr\"om probe is a complex…
This paper presents two approaches for filter design based on stochastic distances for intensity speckle reduction. A window is defined around each pixel, overlapping samples are compared and only those which pass a goodness-of-fit test are…
An efficient nonlinear contrast source inversion scheme for electromagnetic imaging of sparse two-dimensional investigation domains is proposed. To avoid generating a sequence of linear sparse optimization problems, the non-linearity is…