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Most of the recent successful methods in accurate object detection build on the convolutional neural networks (CNN). However, due to the lack of scale normalization in CNN-based detection methods, the activated channels in the feature space…

Computer Vision and Pattern Recognition · Computer Science 2018-08-16 Yonghyun Kim , Bong-Nam Kang , Daijin Kim

Multi-Label Remote Sensing Image Classification (MLRSIC) has received increasing research interest. Taking the cooccurrence relationship of multiple labels as additional information helps to improve the performance of this task. Current…

Computer Vision and Pattern Recognition · Computer Science 2023-01-03 Yongkun Liu , Kesong Ni , Yuhan Zhang , Lijian Zhou , Kun Zhao

Deep defects in silicon carbide (SiC) possess atom-like electronic, spin and optical properties, making them ideal for quantum-computing and -sensing applications. In these applications, deep defects are often placed within fabricated…

Materials Science · Physics 2022-05-09 Tamanna Joshi , Pratibha Dev

We present SemiOccam, an image recognition network that leverages semi-supervised learning in a highly efficient manner. Existing works often rely on complex training techniques and architectures, requiring hundreds of GPU hours for…

Computer Vision and Pattern Recognition · Computer Science 2025-07-22 Rui Yann , Tianshuo Zhang , Xianglei Xing

In recent years, convolutional neural networks (CNNs) with channel-wise feature refining mechanisms have brought noticeable benefits to modelling channel dependencies. However, current attention paradigms fail to infer an optimal channel…

Computer Vision and Pattern Recognition · Computer Science 2024-05-14 Nick Nikzad , Yongsheng Gao , Jun Zhou

Semi-supervised learning is a challenging problem which aims to construct a model by learning from a limited number of labeled examples. Numerous methods have been proposed to tackle this problem, with most focusing on utilizing the…

Computer Vision and Pattern Recognition · Computer Science 2021-07-02 Peng Tu , Yawen Huang , Rongrong Ji , Feng Zheng , Ling Shao

To cope with environments with high levels of radiation, non-silicon semiconductors such as silicon carbide detectors are being proposed for instrumentation. 4H-SiC diodes for radiation detection have been fabricated in the IMB-CNM Clean…

Tissue characterization has long been an important component of Computer Aided Diagnosis (CAD) systems for automatic lesion detection and further clinical planning. Motivated by the superior performance of deep learning methods on various…

Computer Vision and Pattern Recognition · Computer Science 2021-03-24 Xiang Li , Aoxiao Zhong , Ming Lin , Ning Guo , Mu Sun , Arkadiusz Sitek , Jieping Ye , James Thrall , Quanzheng Li

Connectomics is an emerging field in neuroscience that aims to reconstruct the 3-dimensional morphology of neurons from electron microscopy (EM) images. Recent studies have successfully demonstrated the use of convolutional neural networks…

Computer Vision and Pattern Recognition · Computer Science 2017-02-27 Shibani Santurkar , David Budden , Alexander Matveev , Heather Berlin , Hayk Saribekyan , Yaron Meirovitch , Nir Shavit

A silicon microstrip detector (SSD) has been developed to have state of the art spatial resolution and a large sensitive area under stringent power constraints. The design incorporates three floating strips with their bias resistors…

Electroencephalogram-based motor imagery (MI) classification is an important paradigm of non-invasive brain-computer interfaces. Common spatial pattern (CSP), which exploits different energy distributions on the scalp while performing…

Signal Processing · Electrical Eng. & Systems 2024-11-20 Xue Jiang , Lubin Meng , Xinru Chen , Yifan Xu , Dongrui Wu

Modeling artificial scanning electron microscope (SEM) and scanning ion microscope images has recently become important. This is because of the need to provide repeatable images with a priori determined parameters. Modeled artificial images…

Instrumentation and Detectors · Physics 2015-05-19 Petr Cizmar , Andras E. Vladar , Michael T. Postek

Instance segmentation in electron microscopy (EM) volumes is tough due to complex shapes and sparse annotations. Self-supervised learning helps but still struggles with intricate visual patterns in EM. To address this, we propose a…

Computer Vision and Pattern Recognition · Computer Science 2023-09-06 Yinda Chen , Wei Huang , Xiaoyu Liu , Shiyu Deng , Qi Chen , Zhiwei Xiong

Change Detection (CD) is an essential field in remote sensing, with a primary focus on identifying areas of change in bi-temporal image pairs captured at varying intervals of the same region by a satellite. The data annotation process for…

Computer Vision and Pattern Recognition · Computer Science 2025-03-18 Ran Lingyan , Wen Dongcheng , Zhuo Tao , Zhang Shizhou , Zhang Xiuwei , Zhang Yanning

Understanding structure-property relationships in complex materials requires integrating complementary measurements across multiple length scales. Here we propose an interpretable "multimodal" machine learning framework that unifies…

Materials Science · Physics 2026-02-03 Shun Muroga , Hideaki Nakajima , Taiyo Shimizu , Kazufumi Kobashi , Kenji Hata

Aspect-level sentiment classification aims to identify the sentiment polarity towards a specific aspect term in a sentence. Most current approaches mainly consider the semantic information by utilizing attention mechanisms to capture the…

Computation and Language · Computer Science 2021-02-12 Xiaochen Hou , Jing Huang , Guangtao Wang , Xiaodong He , Bowen Zhou

In hyperspectral image classification (HSIC), most deep learning models rely on opaque spectral-spatial feature mixing, limiting their interpretability and hindering understanding of internal decision mechanisms. We present physical…

Computer Vision and Pattern Recognition · Computer Science 2026-01-23 Yimin Zhu , Lincoln Linlin Xu , Zhengsen Xu , Zack Dewis , Mabel Heffring , Saeid Taleghanidoozdoozan , Motasem Alkayid , Quinn Ledingham , Megan Greenwood

Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…

Automated visual inspection in the semiconductor industry aims to detect and classify manufacturing defects utilizing modern image processing techniques. While an earliest possible detection of defect patterns allows quality control and…

Machine Learning · Computer Science 2024-06-11 Tobias Schlosser , Frederik Beuth , Michael Friedrich , Danny Kowerko

Semantic segmentation of remote sensing images plays an important role in a wide range of applications including land resource management, biosphere monitoring and urban planning. Although the accuracy of semantic segmentation in remote…

Image and Video Processing · Electrical Eng. & Systems 2021-09-21 Rui Li , Shunyi Zheng , Chenxi Duan , Ce Zhang , Jianlin Su , P. M. Atkinson
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