English
Related papers

Related papers: SiMiC: Context-Aware Silicon Microstructure Charac…

200 papers

In the field of integrated circuit manufacturing, the detection and classification of nanoscale wafer defects are critical for subsequent root cause analysis and yield enhancement. The complex background patterns observed in scanning…

Computer Vision and Pattern Recognition · Computer Science 2025-02-24 Qian Jin , Yuqi Jiang , Xudong Lu , Yumeng Liu , Yining Chen , Dawei Gao , Qi Sun , Cheng Zhuo

In this paper, we propose Suppression-Enhancing Mask based attention and Interactive Channel transformatiON (SEMICON) to learn binary hash codes for dealing with large-scale fine-grained image retrieval tasks. In SEMICON, we first develop a…

Computer Vision and Pattern Recognition · Computer Science 2022-09-29 Yang Shen , Xuhao Sun , Xiu-Shen Wei , Qing-Yuan Jiang , Jian Yang

Challenges such as the lack of high-quality annotations, long-tailed data distributions, and inconsistent staining styles pose significant obstacles to training neural networks to detect abnormal cells in cytopathology robustly. This paper…

Computer Vision and Pattern Recognition · Computer Science 2025-06-27 Qiuyi Qi , Xin Li , Ming Kong , Zikang Xu , Bingdi Chen , Qiang Zhu , S Kevin Zhou

Controlling defects in semiconductor processes is important for maintaining yield, improving production cost, and preventing time-dependent critical component failures. Electron beam-based imaging has been used as a tool to survey wafers in…

Computer Vision and Pattern Recognition · Computer Science 2025-06-05 Chien-Fu , Huang , Katherine Sieg , Leonid Karlinksy , Nash Flores , Rebekah Sheraw , Xin Zhang

Fine-grained visual categorization (FGVC) aims at recognizing objects from similar subordinate categories, which is challenging and practical for human's accurate automatic recognition needs. Most FGVC approaches focus on the attention…

Computer Vision and Pattern Recognition · Computer Science 2022-09-01 Hongbo Sun , Xiangteng He , Yuxin Peng

Scanning transmission electron microscopy (STEM) has become a cornerstone instrument for semiconductor materials metrology, enabling nanoscale analysis of complex multilayer structures that define device performance. Developing effective…

Semiconductor imaging and analysis are critical yet understudied in deep learning, limiting our ability for precise control and optimization in semiconductor manufacturing. We introduce a small-scale multimodal framework for analyzing…

Computer Vision and Pattern Recognition · Computer Science 2024-08-26 Sakhinana Sagar Srinivas , Chidaksh Ravuru , Geethan Sannidhi , Venkataramana Runkana

Unsupervised adaptation of CLIP-based vision-language models (VLMs) for fine-grained image classification requires sensitivity to microscopic local cues. While CLIP exhibits strong zero-shot transfer, its reliance on coarse global features…

Computer Vision and Pattern Recognition · Computer Science 2025-10-03 Sathira Silva , Eman Ali , Chetan Arora , Muhammad Haris Khan

Atomic scale characterization and manipulation with scanning probe microscopy rely upon the use of an atomically sharp probe. Here we present automated methods based on machine learning to automatically detect and recondition the quality of…

Mesoscale and Nanoscale Physics · Physics 2018-03-26 Mohammad Rashidi , Robert A. Wolkow

Finding efficient means of fingerprinting microstructural information is a critical step towards harnessing data-centric machine learning approaches. A statistical framework is systematically developed for compressed characterisation of a…

Computer Vision and Pattern Recognition · Computer Science 2024-01-23 Michael D. White , Alexander Tarakanov , Christopher P. Race , Philip J. Withers , Kody J. H. Law

A high-precision feature extraction model is crucial for change detection (CD). In the past, many deep learning-based supervised CD methods learned to recognize change feature patterns from a large number of labelled bi-temporal images,…

Computer Vision and Pattern Recognition · Computer Science 2024-04-23 Chengxi Han , Chen Wu , Meiqi Hu , Jiepan Li , Hongruixuan Chen

We describe a setup for optical quality assurance of silicon microstrip sensors. Pattern recognition algorithms were developed to analyze microscopic scans of the sensors for defects. It is shown that the software has a recognition and…

Instrumentation and Detectors · Physics 2019-02-20 E. Lavrik , I. Panasenko , H. R. Schmidt

In the field of artificial intelligence, self-supervised learning has demonstrated superior generalization capabilities by leveraging large-scale unlabeled datasets for pretraining, which is especially critical for wireless communication…

Signal Processing · Electrical Eng. & Systems 2025-03-04 Jun Jiang , Wenjun Yu , Yunfan Li , Yuan Gao , Shugong Xu

Method: We develop CNN-based methods for automatic ICD coding based on clinical text from intensive care unit (ICU) stays. We come up with the Shallow and Wide Attention convolutional Mechanism (SWAM), which allows our model to learn local…

Computation and Language · Computer Science 2021-01-28 Shu Yuan Hu , Fei Teng

Ultrasound standard plane recognition is essential for clinical tasks such as disease screening, organ evaluation, and biometric measurement. However, existing methods fail to effectively exploit shallow structural information and struggle…

Computer Vision and Pattern Recognition · Computer Science 2025-11-18 Qing Cai , Guihao Yan , Fan Zhang , Cheng Zhang , Zhi Liu

While convolution and self-attention are extensively used in learned image compression (LIC) for transform coding, this paper proposes an alternative called Contextual Clustering based LIC (CLIC) which primarily relies on clustering…

Image and Video Processing · Electrical Eng. & Systems 2024-01-23 Yichi Zhang , Zhihao Duan , Ming Lu , Dandan Ding , Fengqing Zhu , Zhan Ma

In the 21st-century information age, with the development of big data technology, effectively extracting valuable information from massive data has become a key issue. Traditional data mining methods are inadequate when faced with…

Computer Vision and Pattern Recognition · Computer Science 2024-11-28 Aoran Shen , Minghao Dai , Jiacheng Hu , Yingbin Liang , Shiru Wang , Junliang Du

The latent representation in learned image compression encompasses channel-wise, local spatial, and global spatial correlations, which are essential for the entropy model to capture for conditional entropy minimization. Efficiently…

Image and Video Processing · Electrical Eng. & Systems 2025-10-29 Wei Jiang , Jiayu Yang , Yongqi Zhai , Feng Gao , Ronggang Wang

Integrating robotically driven contact-based material characterization techniques into self-driving laboratories can enhance measurement quality, reliability, and throughput. While deep learning models support robust autonomy, current…

Robotics · Computer Science 2024-12-31 Alexander E. Siemenn , Basita Das , Kangyu Ji , Fang Sheng , Tonio Buonassisi

Accurate and stable feature matching is critical for computer vision tasks, particularly in applications such as Simultaneous Localization and Mapping (SLAM). While recent learning-based feature matching methods have demonstrated promising…

Robotics · Computer Science 2025-04-08 Yuqing Wang , Yan Wang , Hailiang Tang , Xiaoji Niu
‹ Prev 1 2 3 10 Next ›