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We fabricated thin-films made from polydimethylsiloxane (PDMS) with embedded high-index (n~1.9-2.2) microspheres for super-resolution imaging applications. To control the position of microspheres, such films can be translated along the…

We address the problem of linear precoder (beamformer) design in a multiple-input multiple-output interference channel (MIMO-IC). The aim is to design the transmit covariance matrices in order to achieve max-min utility fairness for all…

Signal Processing · Electrical Eng. & Systems 2019-08-05 Mohammad Mahdi Naghsh , Maryam Masjedi , Arman Adibi , Petre Stoica

This paper provides an analysis of the linearized inverse problem in multifrequency electrical impedance tomography. We consider an isotropic conductivity distribution with a finite number of unknown inclusions with different frequency…

Numerical Analysis · Mathematics 2016-10-06 Giovanni S. Alberti , Habib Ammari , Bangti Jin , Jin-Keun Seo , Wenlong Zhang

We demonstrate a silicon-based, single-layer anti-reflection coating that suppresses the reflectivity of metals at near-infrared frequencies, enabling optical probing of nano-scale structures embedded in highly reflective surroundings. Our…

Applied Physics · Physics 2024-04-11 M. Pancaldi , R. Freeman , M. Hudl , M. C. Hoffmann , S. Urazhdin , P. Vavassori , S. Bonetti

Reflectometry is a technique that uses the light reflected by a sample to determine properties of the sample. Interferometric reflectometry uses interference between two beams, one of which is incident on ---and reflected back by--- a…

Optics · Physics 2019-10-10 Alexander Nahmad-Rohen , Wolfgang Langbein

The propagation of a light ray in thin layer (film) within geometrical optics is considered. It is assumed that the ray is captured inside the layer due to reflecting walls or total internal reflection (in the case of a dielectric layer).…

Optics · Physics 2018-12-12 Tomasz Radozycki

We propose a scheme for multi-layer representation of images. The problem is first treated from an information-theoretic viewpoint where we analyze the behavior of different sources of information under a multi-layer data compression…

Computer Vision and Pattern Recognition · Computer Science 2015-06-15 Sohrab Ferdowsi , Svyatoslav Voloshynovskiy , Dimche Kostadinov

Controlling thin film formation is technologically challenging. The knowledge of physical properties of the film and of the atoms in the surface vicinity can help improve control over the film growth. We investigate the use of the…

This paper aims to recover the intrinsic reflectance layer and shading layer given a single image. Though this intrinsic image decomposition problem has been studied for decades, it remains a significant challenge in cases of complex…

Computer Vision and Pattern Recognition · Computer Science 2025-09-12 Xiaodong Wang , Zijun He , Xin Yuan

Review of a matrix method used in optics of thin films for the calculation of reflectance, transmittance, absorptance, the electric field distribution inside the stack and the photonic dispersion considering the stack as perfect…

Optics · Physics 2018-09-21 Leandro N. Acquaroli

Intelligent reflecting surface (IRS) has recently been envisioned to offer unprecedented massive multiple-input multiple-output (MIMO)-like gains by deploying large-scale and low-cost passive reflection elements. By adjusting the reflection…

Signal Processing · Electrical Eng. & Systems 2020-07-15 Gui Zhou , Cunhua Pan , Hong Ren , Kezhi Wang , Arumugam Nallanathan

Optimal multi-layer device design requires consideration of fabrication uncertainties associated with inter-layer alignment and conformal layering. We present layer-restricted topology optimization (TO), a novel technique which mitigates…

Metasurfaces mold the flow of classical light waves by engineering sub-wavelength patterns from dielectric or metallic thin films. We describe and analyze a method in which quantum operator-valued reflectivity can be used to control both…

We consider the inverse scattering problem of retrieving the structural parameters of a stratified medium consisting of dispersive materials, given knowledge of the complex reflection coefficient in a finite frequency range. It is shown…

Optics · Physics 2012-08-23 Johannes Skaar , Magnus W. Haakestad

Lensless cameras provide a framework to build thin imaging systems by replacing the lens in a conventional camera with an amplitude or phase mask near the sensor. Existing methods for lensless imaging can recover the depth and intensity of…

Image and Video Processing · Electrical Eng. & Systems 2021-08-19 Yucheng Zheng , Yi Hua , Aswin C. Sankaranarayanan , M. Salman Asif

Due to the lack of phase information, determining the physical parameters of multilayer thin films from measured neutron and X-ray reflectivity curves is, on a fundamental level, an underdetermined inverse problem. This so-called phase…

Despite mounting evidence that materials imperfections are a major obstacle to practical applications of superconducting qubits, connections between microscopic material properties and qubit coherence are poorly understood. Here, we perform…

Partial occlusion effects are a phenomenon that blurry objects near a camera are semi-transparent, resulting in partial appearance of occluded background. However, it is challenging for existing bokeh rendering methods to simulate realistic…

Computer Vision and Pattern Recognition · Computer Science 2022-07-19 Juewen Peng , Jianming Zhang , Xianrui Luo , Hao Lu , Ke Xian , Zhiguo Cao

Transverse wrinkles are known to appear in thin rectangular elastic sheets when stretched in the long direction. Numerically computed bifurcation diagrams for extremely thin, highly stretched films indicate entire orbits of wrinkling…

Soft Condensed Matter · Physics 2025-12-02 Shrinidhi S. Pandurangi , Timothy J. Healey , Nicolas Triantafyllidis

Since thin-film silicon solar cells have limited optical absorption, we explore the effect of a nanostructured back reflector to recycle the unabsorbed light. As a back reflector we investigate a 3D photonic band gap crystal made from…