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The task of steel surface defect recognition is an industrial problem with great industry values. The data insufficiency is the major challenge in training a robust defect recognition network. Existing methods have investigated to enlarge…

Computer Vision and Pattern Recognition · Computer Science 2024-05-06 Yichun Tai , Kun Yang , Tao Peng , Zhenzhen Huang , Zhijiang Zhang

Synthesizing realistic microstructure images conditioned on processing parameters is crucial for understanding process-structure relationships in materials design. However, this task remains challenging due to limited training micrographs…

Materials Science · Physics 2025-11-21 Hoang Cuong Phan , Minh Tien Tran , Chihun Lee , Hoheok Kim , Sehyeok Oh , Dong-Kyu Kim , Ho Won Lee

Image generation can solve insufficient labeled data issues in defect detection. Most defect generation methods are only trained on a single product without considering the consistencies among multiple products, leading to poor quality and…

Computer Vision and Pattern Recognition · Computer Science 2024-08-02 Qingfeng Shi , Jing Wei , Fei Shen , Zhengtao Zhang

In industrial equipment monitoring, fault diagnosis is critical for ensuring system reliability and enabling predictive maintenance. However, the scarcity of fault data, due to the rarity of fault events and the high cost of data…

Machine Learning · Computer Science 2025-11-20 Yi Xu , Zhigang Chen , Rui Wang , Yangfan Li , Fengxiao Tang , Ming Zhao , Jiaqi Liu

Accurate defect detection of photovoltaic (PV) cells is critical for ensuring quality and efficiency in intelligent PV manufacturing systems. However, the scarcity of rich defect data poses substantial challenges for effective model…

Computer Vision and Pattern Recognition · Computer Science 2025-05-12 Dongying Li , Binyi Su , Hua Zhang , Yong Li , Haiyong Chen

Training supervised deep neural networks that perform defect detection and segmentation requires large-scale fully-annotated datasets, which can be hard or even impossible to obtain in industrial environments. Generative AI offers…

Computer Vision and Pattern Recognition · Computer Science 2024-01-09 Gabriele Valvano , Antonino Agostino , Giovanni De Magistris , Antonino Graziano , Giacomo Veneri

Industrial surface defect detection often suffers from limited defect samples, severe long-tailed distributions, and difficulties in accurately localizing subtle defects under complex backgrounds. To address these challenges, this paper…

Artificial Intelligence · Computer Science 2026-04-22 Shuo Feng , Runlin Zhou , Yuyang Li , Guangcan Liu

Industrial visual inspection systems often suffer from a severe scarcity of labeled defect data, particularly during the early stages of New Product Introduction (NPI). This limitation hinders the deployment of robust supervised detectors…

Computer Vision and Pattern Recognition · Computer Science 2026-04-28 Serkan Hamdi Güğül , Kemal Levi , Burak Acar

Real-world contains an overwhelmingly large number of object classes, learning all of which at once is infeasible. Few shot learning is a promising learning paradigm due to its ability to learn out of order distributions quickly with only a…

Computer Vision and Pattern Recognition · Computer Science 2020-08-05 Jathushan Rajasegaran , Salman Khan , Munawar Hayat , Fahad Shahbaz Khan , Mubarak Shah

Anomaly detection is a practical and challenging task due to the scarcity of anomaly samples in industrial inspection. Some existing anomaly detection methods address this issue by synthesizing anomalies with noise or external data.…

Computer Vision and Pattern Recognition · Computer Science 2025-05-15 Guan Gui , Bin-Bin Gao , Jun Liu , Chengjie Wang , Yunsheng Wu

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely…

Computer Vision and Pattern Recognition · Computer Science 2024-07-16 Bappaditya Dey , Vic De Ridder , Victor Blanco , Sandip Halder , Bartel Van Waeyenberge

Seismic imaging from sparsely acquired data faces challenges such as low image quality, discontinuities, and migration swing artifacts. Existing convolutional neural network (CNN)-based methods struggle with complex feature distributions…

Geophysics · Physics 2024-08-01 Xingchen Shi , Shijun Cheng , Weijian Mao , Wei Ouyang

Sparse-view Computed Tomography (CT) image reconstruction is a promising approach to reduce radiation exposure, but it inevitably leads to image degradation. Although diffusion model-based approaches are computationally expensive and suffer…

Image and Video Processing · Electrical Eng. & Systems 2024-03-15 Hanyu Chen , Zhixiu Hao , Lin Guo , Liying Xiao

Few-shot models aim at making predictions using a minimal number of labeled examples from a given task. The main challenge in this area is the one-shot setting where only one element represents each class. We propose HyperShot - the fusion…

Anomaly inspection plays an important role in industrial manufacture. Existing anomaly inspection methods are limited in their performance due to insufficient anomaly data. Although anomaly generation methods have been proposed to augment…

Computer Vision and Pattern Recognition · Computer Science 2024-02-23 Teng Hu , Jiangning Zhang , Ran Yi , Yuzhen Du , Xu Chen , Liang Liu , Yabiao Wang , Chengjie Wang

Synthetic dataset generation in Computer Vision, particularly for industrial applications, is still underexplored. Industrial defect segmentation, for instance, requires highly accurate labels, yet acquiring such data is costly and…

Computer Vision and Pattern Recognition · Computer Science 2026-01-28 Emanuele Caruso , Alessandro Simoni , Francesco Pelosin

Edge detection is typically viewed as a pixel-level classification problem mainly addressed by discriminative methods. Recently, generative edge detection methods, especially diffusion model based solutions, are initialized in the edge…

Computer Vision and Pattern Recognition · Computer Science 2024-10-07 Caixia Zhou , Yaping Huang , Mochu Xiang , Jiahui Ren , Haibin Ling , Jing Zhang

The performances of defect inspection have been severely hindered by insufficient defect images in industries, which can be alleviated by generating more samples as data augmentation. We propose the first defect image generation method in…

Computer Vision and Pattern Recognition · Computer Science 2023-03-07 Yuxuan Duan , Yan Hong , Li Niu , Liqing Zhang

The growing sophistication of synthetic image and deepfake generation models has turned source attribution and authenticity verification into a critical challenge for modern computer vision systems. Recent studies suggest that diffusion…

Computer Vision and Pattern Recognition · Computer Science 2025-11-18 Claudio Giusti , Luca Guarnera , Sebastiano Battiato

In materials science, microstructures and their associated extrinsic properties are critical for engineering advanced structural and functional materials, yet their robust reconstruction and generation remain significant challenges. In this…

Materials Science · Physics 2024-10-01 Yixuan Zhang , Teng Long , Hongbin Zhang
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