Related papers: Spatial resolution(s) in atom probe tomography
Time resolution is one of the most severe limitations of scanning probe microscopies (SPMs), since the typical image acquisition times are in the order of several seconds or even few minutes. As a consequence, the characterization of…
We report the optical imaging of a single atom with nanometer resolution using an adaptive optical alignment technique that is applicable to general optical microscopy. By decomposing the image of a single laser-cooled atom, we identify and…
Repeatable and reliable site-specific preparation of specimens for atom probe tomography (APT) at cryogenic temperatures has proven challenging. A generalized workflow is required for cryogenic-specimen preparation including lift-out via…
A small percentage of dopant atoms can completely change the physical properties of the host material. For example, chemical doping controls the electronic transport behavior of semiconductors and gives rise to a wide range of emergent…
The standard technique for sub-pixel estimation of atom positions from atomic resolution scanning transmission electron microscopy images relies on fitting intensity maxima or minima with a two-dimensional Gaussian function. While this is a…
The ill-posed problem of phase retrieval in optics, using one or more intensity measurements, has a multitude of applications using electromagnetic or matter waves. Many phase retrieval algorithms are computed on pixel arrays using discrete…
In this paper, limitations of the common method measuring intrinsic spatial resolution of the GEM imaging detector are presented. Through theoretical analysis and experimental verification, we have improved the common method to avoid these…
We introduce a dual-wavelength Fourier ptychographic topography (FPT) method that extends the lambda/2 height-range limit of single-wavelength FPT. By reconstructing complex fields at two illumination wavelengths and exploiting their phase…
A method is proposed for assessing the temporal resolution of Structured Illumination Microscopy (SIM), by tracking the amplitude of different spatial frequency components over time, and comparing them to a temporally-oscillating…
Digital images from crystals, as projected from the third spatial dimension and recorded in atomic resolution with any kind of real-world microscope, feature necessarily broken symmetries of the translation-periodicity-restricted Euclidean…
Acousto-Optical Coherence Tomography (AOCT) is a variant of Acousto Optic Imaging (also called Ultrasound modulated Optical Tomography) that makes possible to get resolution along the ultrasound propagation axis $z$. We present here new…
The cold emission of particles from surfaces under intense electric fields is a process which underpins a variety of applications including atom probe tomography (APT), an analytical microscopy technique with near-atomic spatial resolution.…
Spatial approximations have been traditionally used in spatial databases to accelerate the processing of complex geometric operations. However, approximations are typically only used in a first filtering step to determine a set of candidate…
Atomic dark matter is a simple but highly theoretically motivated possibility for an interacting dark sector that could constitute some or all of dark matter. We perform a comprehensive study of precision cosmological observables on minimal…
Significant progress has been made in spatial resolution using environmental transmission electron microscopes (ETEM), which now enables atomic resolution visualization of structural transformation under variable temperature and gas…
Atomically Precise Manufacturing (APM) refers to the assembly of materials with atomic precision, representing a highly advanced technology with significant potential. However, the development of APM remains in its early stages, with…
Spatially resolved analysis of uranium isotopes in small volumes of actinide-bearing materials is critical for a variety of technical disciplines, including earth and planetary sciences, environmental monitoring, bioremediation, and the…
The advent of high-resolution electron and scanning probe microscopy imaging has opened the floodgates for acquiring atomically resolved images of bulk materials, 2D materials, and surfaces. This plethora of data contains an immense volume…
Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layer of samples. By combining secondary ion mass spectroscopy (SIMS) with focused ion beam…
The distinction between point and line resolution in transmission electron microscopy (TEM) arises because an ability to image sub-0.2 nm fringes is a necessary, but not a sufficient, condition for imaging individual atoms. In scanned tip…