Related papers: Secondary Species formed from ionic liquid electro…
The design and capability of a novel time-of-flight secondary ion mass spectrometry electrospray propulsion diagnostic is presented to investigate secondary species emission from surface impingement of high-velocity, energetic molecular ion…
Here we present the first fully two-dimensional time-of-flight (TOF) mass spectrometry survey of a vacuum electrospray plume, generated by a tungsten needle externally-wetted with the ionic liquid 1-Ethyl-3-methylimidazolium…
Using a helium ion hitting various metal surfaces as a model system, we describe a general quantum-kinetic approach for calculating ion-induced secondary electron emission spectra at impact energies where the emission is driven by the…
Scanning electron microscopy (SEM), a century-old technique, is today a ubiquitous method of imaging the surface of nanostructures. However, most SEM detectors simply count the number of secondary electrons from a material of interest, and…
Here we present a novel method for two-dimensional steering of vacuum electrospray ionization beams to better understand their angular properties. Utilizing an externally wetted tungsten needle with the ionic liquid…
Electrospray thrusters promise compact, high specific impulse propulsion for small spacecraft, yet ground characterization remains confounded by secondary species emission and incomplete diagnostics of neutral products. To address these…
We explore the potential of Time-Of-Flight Medium Energy Ion Scattering (TOFMEIS) for thin film analysis and analyze possible difficulties in evaluation of experimental spectra. Issues regarding different combinations of composition and…
Magnetic bottle Time-of-Flight (ToF) spectrometers can measure the energy spectra of all electrons emitted into a 2$\pi$ sr solid angle simultaneously, greatly reducing data collection time. When the detection of the annihilation gamma…
Secondary ion beams are beams of particles produced by bombarding a production target with a primary beam of a stable nuclide (in most cases protons) or by fragmentation of heavy primary particles. These methods are used for short lived,…
This study demonstrates the feasibility of using smaller capillary emitters to achieve higher specific impulse ($I_\text{sp}$) in electrospray propulsion. Four ionic liquids were characterized using capillary emitters with tip diameters…
Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layer of samples. By combining secondary ion mass spectroscopy (SIMS) with focused ion beam…
A Computationally Assisted Spectroscopic Technique to measure secondary electron emission coefficients ($\gamma$-CAST) in capacitively-coupled radio-frequency plasmas is proposed. This non-intrusive, sensitive diagnostic is based on a…
Variation of voltage profiles with different time scales leads to the redistribution of deposited energy as well as electro-hydrodynamic forces, while the mechanism and scaling law is still unknown. On the basis of theoretical and numerical…
Charging up the surface of an insulator after beam impact can lead either to reverse sign of field between the surface and collector of electrons for case of thick sample or appearance of very high internal field for thin films. Both…
Measurements performed with the purpose of characterizing the charged secondary radiation for dose release monitoring in particle therapy are reported. Charged secondary yields, energy spectra and emission profiles produced in poly-methyl…
The operation of visible-sensitive gaseous- and, to some extent, vacuum-photomultipliers is critically affected by secondary electrons originating from ion impact on the photocathode. A simple method for indirect measurement of the…
Time of flight backscattering spectrometry (ToF-BS) was successfully implemented in a helium ion microscope (HIM). Its integration introduces the ability to perform laterally resolved elemental analysis as well as elemental depth profiling…
The time dependent surface flux (t-SURFF) method is extended to single and double ionization of two electron systems. Fully differential double emission spectra by strong pulses at extreme UV and infrared wave length are calculated using…
On the proper timescale, amorphous solids can flow. Solid flow can be observed macroscopically in glaciers or lead pipes, but it can also be artificially enhanced by creating defects. Ion Beam Sputtering (IBS) is a technique in which ions…
Point-spread function of the probe forming optics ($PSF_{optics} $) is reported for the first time in an uncorrected (without multipole correctors) scanning electron microscope (SEM). In an SEM, the electron probe information is lost as the…