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Related papers: A MAPS Detector for High Resolution Low Dose EBSD

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A method of the mid-IR-laser microscopy has been proposed for the investigation of the large-scale electrically and recombination active defects in semiconductors and non-destructive inspection of semiconductor materials and structures in…

Materials Science · Physics 2011-05-17 V. P. Kalinushkin , V. A. Yuryev , O. V. Astafiev

An array of DEPFET pixels is one of several concepts to implement an active pixel sensor. Similar to PNCCD and SDD detectors, the typically 0.45 mm thick silicon sensor is fully depleted by the principle of sideward depletion. They have…

Instrumentation and Methods for Astrophysics · Physics 2023-04-05 Norbert Meidinger , Johannes Müller-Seidlitz

High-frequency electromagnetic fields (EMFs) are increasingly recognized either as environmental risk factors or as tools for electromagnetic attacks, which are difficult to detect in situ. Existing high-frequency EMF sensors face…

Applied Physics · Physics 2026-03-16 Abdul Mohizin , Leon Abelmann , Baeckkyoung Sung

The Circular Electron-Positron Collider (CEPC), a proposed next-generation $e^+e^-$ collider to enable high-precision studies of the Higgs boson and potential new physics, imposes rigorous demands on detector technologies, particularly the…

Instrumentation and Detectors · Physics 2025-12-02 Jiahao Hu , Ruiyang Zhang , Zhiliang Chen , Yunpeng Lu , Qun Ouyang , Lailin Xu

Recent advances in photon detectors have resulted in high-density imaging arrays that offer many performance and cost advantages. In particular, the excellent transit time spread of certain devices show promise to provide tangible benefits…

Instrumentation and Detectors · Physics 2009-04-17 Gary S. Varner , Larry L. Ruckman

We summarize a data analysis approach for electron backscatter diffraction (EBSD) which uses high-resolution Kikuchi pattern simulations to measure isochoric relative deformation gradient tensors from experimentally measured Kikuchi…

Spectroscopic photoemission microscopy is a well-established method to investigate the electronic structure of surfaces. In modern photoemission microscopes the electron optics allows imaging of the image plane, momentum plane, or…

Emulsion detectors feature a very high position resolution and consequently represent an ideal device when particle detection is required at the micrometric scale. This is the case of quantum interferometry studies with antimatter, where…

High Energy Physics - Experiment · Physics 2016-08-03 S. Aghion , A. Ariga , T. Ariga , M. Bollani , E. Dei Cas , A. Ereditato , C. Evans , R. Ferragut , M. Giammarchi , C. Pistillo , M. Romé , S. Sala , P. Scampoli

Detector requirements for far infrared astronomy generally result in devices which exhibit a few-moded response to incident radiation. The sensitivity and spatial form of the individual modes to which such a detector is sensitive can be…

Instrumentation and Methods for Astrophysics · Physics 2023-09-27 Ian Veenendaal , Edgar Castillo-Dominguez , Stephen J. C. Yates , Bram Lap , Willem Jellema

Designing terahertz sensors with high sensitivity to detect nanoscale thin films and single biomolecule presents a significant challenge, and addressing these obstacles is crucial for unlocking their full potential in scientific research…

We present studies on electron backscattering from the surface of plastic scintillator beta detectors. By using a setup of two detectors coaxial with a strong external magnetic field - one detector serving as primary detector, the other as…

Instrumentation and Detectors · Physics 2008-11-26 M. Schumann , H. Abele

Low-energy electron microscopy (LEEM) is a surface science method that works primarily in the UHV environment. It provides information complementary to the other established techniques: it extends the limited view of scanning probe…

Mesoscale and Nanoscale Physics · Physics 2025-07-16 Jan Čechal , Pavel Procházka

A new method for dark field imaging is introduced which uses scanned electron diffraction (or 4DSTEM - 4-dimensional scanning transmission electron microscopy) datasets as its input. Instead of working on simple summation of intensity, it…

Materials Science · Physics 2024-09-18 Ian MacLaren , Andrew T. Fraser , Matthew R. Lipsett , Colin Ophus

The ability to resolve the dynamics of matter on its native temporal and spatial scales constitutes a key challenge and convergent theme across chemistry, biology, and materials science. The last couple of decades have witnessed ultrafast…

Transition Edge Sensors (TES) are superconducting microcalorimeters that can be used for single-photon detection with extremely low backgrounds. When they are within their superconducting transition region, small temperature fluctuations -…

Orientation determination does not necessarily require complete knowledge of the local atomic arrangement in a material. We present a method for microstructural phase discrimination and orientation analysis of phases for which there is only…

Materials Science · Physics 2019-06-06 Aimo Winkelmann , Grzegorz Cios , Tomasz Tokarski , Gert Nolze , Ralf Hielscher , Tomasz Kocieł

Scanning transmission electron microscopy (STEM) has a broad range of applications in materials characterization, including real-space imaging, spectroscopy, and diffraction, at length scales from the micron to sub-{\AA}ngstr\"om. The…

Instrumentation and Detectors · Physics 2022-06-07 Bryan D Esser , Joanne Etheridge

Progress is reported on the development and testing of Monolithic Active Pixel Sensors (MAPS) for a Si-W ECAL for the ILC. Using laser and source setups, a first version of the sensor has been characterised through measurements of the…

Transition-edge sensors (TESs) have the potential to perform electron spectroscopic measurements with far greater measurement rates and efficiencies than can be achieved using existing electron spectrometers. Existing spectrometers filter…

Instrumentation and Detectors · Physics 2024-03-05 K. M. Patel , S. Withington , A. G . Shard , D. J. Goldie , C. N. Thomas

The challenge of imaging low-density objects in an electron microscope without causing beam damage is significant in modern TEM. This is especially true for life science imaging, where the sample, rather than the instrument, still…

Optics · Physics 2025-01-29 Francisco Vega Ibáñez , Jo Verbeeck
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