Related papers: Event-sparse stack denoising for 4D-STEM applicati…
The evolution of the scanning modules for scanning transmission electron microscopes (STEM) has realized the possibility to generate arbitrary scan pathways, an approach currently explored to improve acquisition speed and to reduce electron…
Understanding the relationship between atomic structure (order) and chemical composition (chemistry) is critical for advancing materials science, yet traditional spectroscopic techniques can be slow and damaging to sensitive samples.…
Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale in three dimensions. We present a reconstruction algorithm that takes as input a focal…
The recent development of electron sensitive and pixelated detectors has attracted the use of four-dimensional scanning transmission electron microscopy (4D-STEM). Here, we present a precession electron diffraction assisted 4D-STEM…
Event cameras are activity-driven bio-inspired vision sensors, thereby resulting in advantages such as sparsity,high temporal resolution, low latency, and power consumption. Given the different sensing modality of event camera and high…
Diffusion magnetic resonance imaging datasets suffer from low Signal-to-Noise Ratio, especially at high b-values. Acquiring data at high b-values contains relevant information and is now of great interest for microstructural and…
Lattice strain measurement of nanoscale semiconductor devices is crucial for the semiconductor industry as strain substantially improves the electrical performance of transistors. High resolution scanning transmission electron microscopy…
Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with electron scattering simulations. However, using the…
A real-time image reconstruction method for scanning transmission electron microscopy (STEM) is proposed. With an algorithm requiring only the center of mass (COM) of the diffraction pattern at one probe position at a time, it is able to…
Focused ion beams (FIBs) are widely used in nanofabrication for applications such as circuit repair, ultra-thin lamella preparation, strain engineering, and quantum device prototyping. Although the lateral spread of the ion beam is often…
Four-dimensional scanning transmission electron microscopy (4D-STEM) generates multi-gigabyte datasets, creating a growing mismatch between acquisition rates and practical storage, transfer, and interactive visualization capabilities. We…
With recent technological advances, process logs, which were traditionally deterministic in nature, are being captured from non-deterministic sources, such as uncertain sensors or machine learning models (that predict activities using…
We demonstrate a multi-beam scanning transmission electron microscopy (STEM) imaging that integrates down-sampling with super-resolution image reconstruction via a compressive sensing framework. A custom condenser aperture with six randomly…
Event cameras offer a promising avenue for multi-view stereo depth estimation and Simultaneous Localization And Mapping (SLAM) due to their ability to detect blur-free 3D edges at high-speed and over broad illumination conditions. However,…
Four-dimensional Scanning Transmission Electron Microscopy (4D STEM) with data acquired using a defocused electron probe is a promising tool for characterising complex biological specimens and materials through a phase retrieval process…
Scanning transmission electron microscopy (STEM) plays a critical role in modern materials science, enabling direct imaging of atomic structures and their evolution under external interferences. However, interpreting time-resolved STEM data…
Fine-grained sparsity promises higher parametric capacity without proportional per-token compute, but often suffers from training instability, load balancing, and communication overhead. We introduce STEM (Scaling Transformers with…
Event cameras are bio-inspired sensors that offer several advantages, such as low latency, high-speed and high dynamic range, to tackle challenging scenarios in computer vision. This paper presents a solution to the problem of 3D…
High-throughput grain mapping with sub-nanometer spatial resolution is demonstrated using scanning nanobeam electron diffraction (also known as 4D scanning transmission electron microscopy, or 4D-STEM) combined with high-speed direct…
Scanning transmission electron microscopy (STEM) is a powerful tool to reveal the morphologies and structures of materials, thereby attracting intensive interests from the scientific and industrial communities. The outstanding spatial…