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Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial for determining the root cause of production defects, which may further provide insight for yield improvement…

Machine Learning · Computer Science 2023-10-19 Nitish Shukla , Anurima Dey , Srivatsan K

Laser material processing has emerged as a versatile and indispensable tool in various industries, including manufacturing, healthcare, and materials science. However, the interaction of a lasers with surfaces is highly dependent on a large…

Materials Science · Physics 2026-04-15 Christoph Zwahr , Frederic Schell , Tobias Steege , Andrés Fabián Lasagni

Hazard detection is critical for enabling autonomous landing on planetary surfaces. Current state-of-the-art methods leverage traditional computer vision approaches to automate the identification of safe terrain from input digital elevation…

Robotics · Computer Science 2025-08-27 Kento Tomita , Katherine A. Skinner , Koki Ho

Ultrafast laser writing of single lattice defects in wide-bandgap semiconductors is shown to present a new physical setting in which deeply subwavelength laser-writing positioning precision is attainable, but where the whole notion of…

Optics · Physics 2026-03-06 Julia M. Mikhailova , Aleksei M. Zheltikov

In this review, automatic defect inspection algorithms that analyze Scanning Electron Microscopy (SEM) images for Semiconductor Manufacturing (SM) are identified, categorized, and discussed. This is a topic of critical importance for the SM…

Image and Video Processing · Electrical Eng. & Systems 2025-06-02 Enrique Dehaerne , Bappaditya Dey , Victor Blanco , Jesse Davis

Classification is an important task in many fields including biomedical research and machine learning. Traditionally, a classification rule is constructed based a bunch of labeled data. Recently, due to technological innovation and…

Methodology · Statistics 2014-06-19 Jing Wang , Eunsik Park , Yuan-chin Ivan Chang

Modern data science relies on data analytic pipelines to organize interdependent computational steps. Such analytic pipelines often involve different algorithms across multiple steps, each with its own hyperparameters. To achieve the best…

Machine Learning · Computer Science 2016-06-27 Yuyu Zhang , Mohammad Taha Bahadori , Hang Su , Jimeng Sun

The high-volume manufacturing of the next generation of semiconductor devices requires advances in measurement signal analysis. Many in the semiconductor manufacturing community have reservations about the adoption of deep learning; they…

Computer Vision and Pattern Recognition · Computer Science 2022-04-12 Inimfon I. Akpabio , Serap A. Savari

Aligning beamlines at synchrotron light sources is a high-dimensional, expensive-to-sample optimization problem, as beams are focused using a series of dynamic optical components. Bayesian Optimization is an efficient machine learning…

Accelerator Physics · Physics 2024-08-14 Megha R. Narayanan , Thomas W. Morris

The tuning of fused filament fabrication parameters is notoriously challenging. We propose an autonomous data-driven method to select parameters based on in situ measurements. We use a laser sensor to evaluate the surface roughness of a…

Systems and Control · Electrical Eng. & Systems 2022-10-28 Xavier Guidetti , Marino Kühne , Yannick Nagel , Efe C. Balta , Alisa Rupenyan , John Lygeros

The exciting properties of micro- and nano-patterned surfaces found in natural species hide a virtually endless potential of technological ideas, opening new opportunities for innovation and exploitation in materials science and…

Semiconductor manufacturing is a notoriously complex and costly multi-step process involving a long sequence of operations on expensive and quantity-limited equipment. Recent chip shortages and their impacts have highlighted the importance…

Artificial Intelligence · Computer Science 2023-02-15 Pierre Tassel , Benjamin Kovács , Martin Gebser , Konstantin Schekotihin , Patrick Stöckermann , Georg Seidel

We present a novel computational paradigm for process design in manufacturing processes that incorporates simulation responses to optimize manufacturing process parameters in high-dimensional temporal and spatial design spaces. We developed…

Computational Engineering, Finance, and Science · Computer Science 2021-07-26 Mojtaba Mozaffar , Jian Cao

Post-silicon validation is one of the most critical processes in modern semiconductor manufacturing. Specifically, correct and deep understanding in test cases of manufactured devices is key to enable post-silicon tuning and debugging. This…

Machine Learning · Computer Science 2022-10-03 Yiwen Liao , Raphaël Latty , Bin Yang

Leather is a natural and durable material created through a process of tanning of hides and skins of animals. The price of the leather is subjective as it is highly sensitive to its quality and surface defects condition. In the literature,…

Computer Vision and Pattern Recognition · Computer Science 2019-03-29 Sze-Teng Liong , Y. S. Gan , Yen-Chang Huang , Chang-Ann Yuan , Hsiu-Chi Chang

Predictive modelling represents an emerging field that combines existing and novel methodologies aimed to rapidly understand physical mechanisms and concurrently develop new materials, processes and structures. In the current study,…

We introduce Bayesian optimization, a technique developed for optimizing time-consuming engineering simulations and for fitting machine learning models on large datasets. Bayesian optimization guides the choice of experiments during…

Machine Learning · Statistics 2017-11-22 Peter I. Frazier , Jialei Wang

Automated chemical synthesis, materials fabrication, and spectroscopic physical measurements often bring forth the challenge of process trajectory optimization, i.e., discovering the time dependence of temperature, electric field, or…

Disordered Systems and Neural Networks · Physics 2022-06-28 Mani Valleti , Rama K. Vasudevan , Maxim A. Ziatdinov , Sergei V. Kalinin

The dimer method is a Hessian-free algorithm for computing saddle points. We augment the method with a linesearch mechanism for automatic step size selection as well as preconditioning capabilities. We prove local linear convergence. A…

Optimization and Control · Mathematics 2014-07-30 N. Gould , C. Ortner , D. Packwood

Numerical simulations have revolutionized the industrial design process by reducing prototyping costs, design iterations, and enabling product engineers to explore the design space more efficiently. However, the growing scale of simulations…