Related papers: Robust electron counting for direct electron detec…
Spectral Photon-Counting Computed Tomography (SPCCT) is a promising technology that has shown a number of advantages over conventional X-ray Computed Tomography (CT) in the form of material separation, artefact removal and enhanced image…
Scanning Transmission Electron Microscopy (STEM) has become the main stay for materials characterization on atomic level, with applications ranging from visualization of localized and extended defects to mapping order parameter fields. In…
Electrical impedance tomography (EIT) is a noninvasive medical imaging modality utilizing the current-density/voltage data measured on the surface of the subject. Calder\'on's method is a relatively recent EIT imaging algorithm that is…
In cryo-electron microscopy (EM), molecular structures are determined from large numbers of projection images of individual particles. To harness the full power of this single-molecule information, we use the Bayesian inference of EM…
We lay the foundations for a new fast method to reconstruct the electron density in x-ray scanning applications using measurements in the dark field. This approach is applied to a type of machine configuration with fixed energy sensitive…
Strain has a strong effect on the properties of materials and the performance of electronic devices. Their ever shrinking size translates into a constant demand for accurate and precise measurement methods with very high spatial resolution.…
CCCP, a CCD Controller for Counting Photons, is presented. This new controller uses a totally new clocking architecture and allows to drive the CCD in a novel way. Its design is optimized for the driving of EMCCDs at up to 20MHz of pixel…
Diffraction pattern analysis can be used to reveal the crystalline structure of materials, and this information is used to nano- and micro-structure of advanced engineering materials that enable modern life. For nano-structured materials…
Electrical capacitance tomography (ECT) is a nonoptical imaging technique in which a map of the interior permittivity of a volume is estimated by making capacitance measurements at its boundary and solving an inverse problem. While previous…
Transmission electron microscopy (TEM) is a powerful imaging tool that has found broad application in materials science, nanoscience and biology(1-3). With the introduction of aberration-corrected electron lenses, both the spatial…
In the scanning transmission electron microscope, both phase imaging of beam-sensitive materials and characterisation of a material's functional properties using in-situ experiments are becoming more widely available. As the practicable…
Here a new microscopic method is proposed to image and characterize very thin samples like few-layer materials, organic molecules, and nanostructures with nanometer or sub-nanometer resolution using electron beams of energies lower than 20…
We establish a series of deep convolutional neural networks to automatically analyze position averaged convergent beam electron diffraction patterns. The networks first calibrate the zero-order disk size, center position, and rotation…
Several deep learned lossy compression techniques have been proposed in the recent literature. Most of these are optimized by using either MS-SSIM (multi-scale structural similarity) or MSE (mean squared error) as a loss function.…
The precise reconstruction of properties of photons and electrons in modern high energy physics detectors, such as the CMS or Atlas experiments, plays a crucial role in numerous physics results. Conventional geometrical algorithms are used…
On semiconductor growth surfaces, surface reconstructions appear. Estimation of the reconstructed structures is essential for understanding and controlling growth phenomena. In this study, the stability of a mixture of two different surface…
We present the progress of characterization of a low-noise, photon counting Electron Multiplying Charged Coupled Device (EMCCD) operating in optical wavelengths and demonstrate possible solutions to the problems of Clock-Induced Charge…
Ultrafast-optical-pump -- structural-probe measurements, including ultrafast electron and x-ray scattering, provide direct experimental access to the fundamental timescales of atomic motion, and are thus foundational techniques for studying…
The accuracy of the information that can be extracted from electron diffraction patterns is often limited by the presence of optical distortions. Existing distortion characterization techniques typically require knowledge of the reciprocal…
Energy-based models (EBMs) have become increasingly popular within computer vision in recent years. While they are commonly employed for generative image modeling, recent work has applied EBMs also for regression tasks, achieving…